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Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 7, 2007, Pages

Time resolved x-ray reflectivity study of interfacial reactions in Cu Mg thin films during heat treatment

(5) Gonzalez Silveira, M a Rodriguez Viejo, J a Clavaguera Mora, M T a Bigault, T b Labar J L c

a UNIVERSITAT AUTÒNOMA DE BARCELONA (Spain)

b INSTITUT LAUE LANGEVIN (France)

c RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33847093855 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.75.075419 Document Type: Article

Times cited : (11)

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