Effect of annealing on the interface structure of cross-beam pulsed laser deposited Co/Cu multilayers

Thin Solid Films

Volumn 416, Issue 1-2, 2002, Pages 114-121

  Prokert, F ^a   Noetzel, J ^a,c   Schell, N ^a   Wieser, E ^a   Gorbunov, A ^b  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^c INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

Interfaces; Laser ablation; Multilayers; X ray diffraction

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HEAT TREATMENT; INTERFACES (MATERIALS); PULSED LASER DEPOSITION; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

GRAIN COARSENING;

MULTILAYERS;

EID: 0037009773     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00552-7     Document Type: Article

References (34)

1. Parkin S.S., Bhadra R., Roche K.P. Phys. Rev. Lett. 66:1991;2152.
2. Berkowitz A., Mitchell J.R., Carey M.J., et al. Phys. Rev. Lett. 68:1992;3745.
3. Wecker J., von Helmholt R., Schultz L., Samwer K. Appl. Phys. Lett. 62:1993;1985.
4. Idzikowski B., Rössler U.K., Eckert D., Nenkov K., Müller K.-H. Europhys. Lett. 45:1999;714.
5. Telling N.D., Cuilfoyle S.J., Lovett D.R., Tang C.C., Crapper M.D., Petty M. J. Phys. D. 31:1998;472.
6. Kok K.Y., Hall M.J., Lake J.A. J. Magn. Magn. Mater. 156:1996;51.
7. Kok K.Y., Leake J.A. Thin Solid Films. 275:1996;210.
8. Joyce D.E., Fulthorpe B.D., Faunce C.A., et al. Phys. Rev. B. 58:1998;5594.
9. Chrisey D.B., Hubler G.K. Pulsed Laser Deposition of Thin Films. 1994;John Wiley, New York.
10. Prokert F., Noetzel J., Schell N., Wieser E., Matz W., Gorbunov A. Thin Solid Films. 394:2001;164.
11. Tselev A., Gorbunov A., Pompe W. Appl. Phys. A. 69:1999;353.
12. Yang F.L., Greer A.L., Somekh R.E. Thin Solid Films. 275:1996;258.
13. Temst K., Van Bael M.J., Van Haesendonck C., et al. Thin Solid Films. 324:1999;174.
14. Rätzke K., Hall M.J., Jardine D.B., Shih W.C., Somekh R.E., Greer A.L. J. Magn. Magn. Mater. 204:1999;61.
15. Matz W., Schell N., Bernhard G., et al. J. Synchrotron Rad. 6:1999;1076.
16. Parratt L.G. Phys. Rev. 95:1954;359.
17. Wormington M., Bowen D.K., Tanner B.K. Mater. Res. Soc. Symp. Proc. 238:1991;119.
18. Tanner B.K., Wormington M., Hase T.P.A., Pape I. Surf. Invest. 12:1997;259.
19. Sinha S.K., Sirota E.B., Garoff S., Stanley H.B. Phys. Rev. B. 38:1988;2297.
20. Thomas J., Brand K., Gorbunov A.A., Wetzig K. Fresenius J. Anal. Chem. 365:1999;263.
21. Bödeker P., Abromeit A., Bröhl K., Sonntag P., Metoki N., Zabel H. Phys. Rev. B. 47:1993;2353.
22. Noetzel J. Ph.D. Thesis, TU Dresden, Germany, 2000
23. Wetzig K., Thomas J., Bauer H.-D., Hecker M., John A. J. Electron Spectrosc. Related Phenom. 114-116:2001;1019.
24. Thomas J., John A., Wetzig K. Microchim. Acta. 133:2000;131.
25. Zhang M., Wang W.K. Phys. Stat. Sol. A. 159:1997;439.
26. Massalski T.B., Binary Alloy Phase Diagrams, 2nd ed. 1990;ASM International.
27. Hecker M., van Loyen L., Tietjen D., Schell N., Schneider C.M. Mater. Sci. Forum. 378-381:2001;370.
28. Malkinski L., Wang J.-Q., Zhou W., Kondenkandath Th. Thin Solid Films. 375:2000;59.
29. Tomlinson M.E., Pollard R.J., Lord D.G., Grundy P.J., Chun Z. IEEE Trans. Magn. 28:1992;2662.
30. Joyce D.E., Faunce C.A., Grundy P.J., et al. Phys. Rev. B. 58:1998;5594.
31. de Bernabe A., Capitan M.J., Fischer H.E., Prieto C. J. Appl. Phys. 84:1998;1881.
32. Pape I., Hase T.P.A., Tanner B.K., Wormington M. Physica B. 253:1998;278.
33. Chladek M., Dorner C., Buchal A., Valvoda V., Hoffmann H. J. Appl. Phys. 80:1996;1437.
34. Menyhard M., Sulyok A., Pentek K., Zeltser A.M. Thin Solid Films. 366:2000;129.