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Acta Materialia

Volumn 49, Issue 14, 2001, Pages 2813-2826

Microstructure evolution during solid state reactions of Nb/Al multilayers

(4) Lucadamo, G a Barmak, K b Carpenter, D T a Rickman, J M a

a Lehigh University (United States)

b CARNEGIE MELLON UNIVERSITY (United States)

Author keywords

Kinetics; Microstructure; Phase formation; Thin films

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; DIFFERENTIAL SCANNING CALORIMETRY; GRAIN BOUNDARIES; MULTILAYERS; NIOBIUM COMPOUNDS; PHASE TRANSITIONS; REACTION KINETICS; RECRYSTALLIZATION (METALLURGY); THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; REACTIVE PHASE FORMATIONS;

SEMICONDUCTING FILMS;

EID: 0035899594 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6454(01)00176-8 Document Type: Article

Times cited : (25)

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