A 1300 K furnace for in situ x-ray microtomography

Journal of Applied Crystallography

Volumn 36, Issue 2, 2003, Pages 366-367

  Bellet, D ^a   Gorges, B ^b   Dallery, A ^b   Bernard, P ^b   Pereiro, E ^b   Baruchel, J ^b  

^a UNIV GRENOBLE ALPES   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ANALYTIC METHOD; ANALYTICAL PARAMETERS; ARTICLE; CHEMICAL PARAMETERS; DIFFRACTION; ROTATION; SYNCHROTRON; TEMPERATURE; X RAY MICROTOMOGRAPHY;

EID: 0037393574     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803001158     Document Type: Article

References (5)

1. Baruchel, J., Buffière, J. Y., Maire, E., Merle, P. & Peix, G. (2000). Editors. X-ray Tomography in Materials Science. Paris: Hermès.
2. Buffière, J. Y., Maire, E., Cloetens, P., Lormand, G. & FougèRes, R. (1999). Acta Mater. 47, 1613-1625.
3. Maire, E., Buffière, J. Y., Salvo, L., Blandin, J. J., Ludwig, W. & Létang, J. M. (2001). Adv. Eng. Mater. 8, 539-546.
4. Puig-Molina, A., Gorges, B. & Graafsma, H. (2001). J. Appl. Cryst. 34, 677-678.
5. Salvo, L., Cloetens, P., Maire, E., Zabler, S., Blandin, J. J., Buffière, J. Y., Ludwig, W., Boller, E., Bellet, D. & Josserond, C. (2002). European Materials Research Society Meeting 2002 (Strasbourg, June 2002). To be published in Nucl. Instrum. Methods Phys. Res. B.