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Volumn 705, Issue , 2004, Pages 436-439

The ESRF BM05 metrology beamline: Instrumentation and performance upgrade

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Indexed keywords


EID: 85012263765     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1757827     Document Type: Conference Paper
Times cited : (36)

References (12)
  • 3
    • 85012246504 scopus 로고    scopus 로고
    • San Diego to be published
    • J.E. Koglin et al., SPIE proc. Vol. 5168, San Diego (2003), to be published.
    • (2003) SPIE Proc. , vol.5168
    • Koglin, J.E.1
  • 5
    • 85012238444 scopus 로고    scopus 로고
    • The spectrum can be calculated with the XOP program
    • For further details see M. Sanchez-del-Rio,r. J. Deju San Diego
    • The spectrum can be calculated with the XOP program available from http://www.esrf.fr/computing/scientific/xop/. For further details see M. Sanchez-del-Rio,r. J. Deju, SPIE proc. Vol. 3152, p. 148-57, San Diego (1997).
    • (1997) SPIE Proc. , vol.3152 , pp. 148-157
  • 9
    • 85012300608 scopus 로고    scopus 로고
    • See: http://www.esrf.fr/exp-facilities/bm5/main/beamlineguide.php&beamline-guide-overview=and


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.