Femtosecond x-ray measurement of ultrafast melting and large acoustic transients

Physical Review Letters

Volumn 87, Issue 22, 2001, Pages

  Sokolowski Tinten, K ^a   Blome, C ^a   Dietrich, C ^a   Tarasevitch, A ^a   Horn Von Hoegen, M ^a   Von Der Linde, D ^a   Cavalleri, A ^b   Squier, J ^c   Kammler, M ^d  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); MELTING; SEMICONDUCTING GERMANIUM; SILICON WAFERS; SOLID STATE LASERS; SURFACE ROUGHNESS; THIN FILMS; ULTRASHORT PULSES;

GERMANIUM FILM; LASER-INDUCED PHASE TRANSITION; SURFACE ORIENTATION; TIME-RESOLVED X-RAY DIFFRACTION; ULTRAFAST MELTING;

X RAY DIFFRACTION;

EID: 42749107628     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (24)