Monitoring high-temperature solid-solid phase transitions of HMX with atomic force microscopy

Ultramicroscopy

Volumn 93, Issue 1, 2002, Pages 19-23

  Weeks, Brandon L ^a   Ruddle, Chantel M ^a   Zaug, Joseph M ^a   Cook, Debra J ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MONITORING; ORGANIC COMPOUNDS; PHASE TRANSITIONS; SURFACE ROUGHNESS;

REACTION SENSITIVITY;

ATOMIC FORCE MICROSCOPY;

FUEL; OCTAHYDRO 1,3,5,7 TETRAZOCINE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CONFORMATIONAL TRANSITION; CRYSTALLIZATION; GROWTH RATE; PHASE TRANSITION; SOLID; SPACE; SURFACE PROPERTY;

EID: 0036803554     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00137-7     Document Type: Article

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