SEU cross sections of hardened and unhardened SiGe circuits

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3579-3586

  Hansen, D L ^a   Chu, P ^a   Jobe, K ^a   McKay, A L ^a   Warren, H P ^a  

^a BOEING COMPANY   (United States)

Author keywords

Hardness by design; SEU; SiGe

Indexed keywords

HARDENING; HEAVY IONS; SEMICONDUCTING SILICON COMPOUNDS;

HARDNESS BY DESIGN; SEU; SIGE;

INTEGRATED CIRCUIT LAYOUT;

EID: 33846265813     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.886213     Document Type: Conference Paper

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