-
1
-
-
0035174630
-
Layout manufacturability analysis using rigorous 3-D topography simulation
-
San Jose, CA, Oct
-
A. J. Strojwas, Z. Zhu, D. Ciplickas et al., "Layout manufacturability analysis using rigorous 3-D topography simulation," in Proc. IEEE Int. Symp. Semicond. Manuf. Conf., San Jose, CA, Oct. 2001, pp. 263-266.
-
(2001)
Proc. IEEE Int. Symp. Semicond. Manuf. Conf
, pp. 263-266
-
-
Strojwas, A.J.1
Zhu, Z.2
Ciplickas, D.3
-
2
-
-
0001002843
-
Using advanced simulation to aid microlithography development
-
Aug
-
D. C. Cole, E. Barouch, E. D. Conrad et al., "Using advanced simulation to aid microlithography development," Proc. IEEE, vol. 89, no. 8, pp. 1194-1213, Aug. 2001.
-
(2001)
Proc. IEEE
, vol.89
, Issue.8
, pp. 1194-1213
-
-
Cole, D.C.1
Barouch, E.2
Conrad, E.D.3
-
3
-
-
0028427278
-
Algorithms for simulation of three-dimensional etching
-
May
-
K. K. H. Toh, A. R. Neureuther, and E. W. Scheckler, "Algorithms for simulation of three-dimensional etching," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 13, no. 5, pp. 616-624, May 1994.
-
(1994)
IEEE Trans. Comput.-Aided Design Integr. Circuits Syst
, vol.13
, Issue.5
, pp. 616-624
-
-
Toh, K.K.H.1
Neureuther, A.R.2
Scheckler, E.W.3
-
4
-
-
0028377543
-
Models and algorithms for three-dimensional topography simulation with SAMPLE-3D
-
Feb
-
E. W. Scheckler and A. R. Neureuther, "Models and algorithms for three-dimensional topography simulation with SAMPLE-3D," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 13, no. 2, pp. 219-229, Feb. 1994.
-
(1994)
IEEE Trans. Comput.-Aided Design Integr. Circuits Syst
, vol.13
, Issue.2
, pp. 219-229
-
-
Scheckler, E.W.1
Neureuther, A.R.2
-
5
-
-
44749084234
-
Fronts propagating with curvature dependent speed: Algorithms based on Hamilton-Jacobi formulation
-
Jan
-
S. Osher and J. A. Sethian, "Fronts propagating with curvature dependent speed: Algorithms based on Hamilton-Jacobi formulation," J. Comput. Phys., vol. 79, no. 1, pp. 12-49, Jan. 1988.
-
(1988)
J. Comput. Phys
, vol.79
, Issue.1
, pp. 12-49
-
-
Osher, S.1
Sethian, J.A.2
-
6
-
-
0001163571
-
A level set approach to a unified model for etching, deposition, and lithography II: Three-dimensional simulations
-
Feb
-
D. Adalsteinsson and J. A. Sethian, "A level set approach to a unified model for etching, deposition, and lithography II: Three-dimensional simulations," J. Comput. Phys., vol. 122, no. 2, pp. 348-366, Feb. 1995.
-
(1995)
J. Comput. Phys
, vol.122
, Issue.2
, pp. 348-366
-
-
Adalsteinsson, D.1
Sethian, J.A.2
-
7
-
-
0030313115
-
Fast marching level set methods for three-dimensional photolithography development
-
Santa Clara, CA, Mar
-
J. A. Sethian, "Fast marching level set methods for three-dimensional photolithography development," in Proc. SPIE Int. Symp. Microlithography, Santa Clara, CA, Mar. 1996, pp. 262-272.
-
(1996)
Proc. SPIE Int. Symp. Microlithography
, pp. 262-272
-
-
Sethian, J.A.1
-
8
-
-
0016529979
-
Modeling projection printing of positive photoresists
-
Jul
-
F. H. Dill, A. R. Neureuther, J. A. Tuttle et al., "Modeling projection printing of positive photoresists," IEEE Trans. Electron Devices, vol. ED-22, no. 7, pp. 456-464, Jul. 1975.
-
(1975)
IEEE Trans. Electron Devices
, vol.ED-22
, Issue.7
, pp. 456-464
-
-
Dill, F.H.1
Neureuther, A.R.2
Tuttle, J.A.3
-
9
-
-
0029373706
-
Algorithms and models for cellular based topography simulation
-
Sep
-
E. Strasser and S. Selberherr, "Algorithms and models for cellular based topography simulation," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 14, no. 9, pp. 1104-1114, Sep. 1995.
-
(1995)
IEEE Trans. Comput.-Aided Design Integr. Circuits Syst
, vol.14
, Issue.9
, pp. 1104-1114
-
-
Strasser, E.1
Selberherr, S.2
-
10
-
-
0027663444
-
An efficient volume-removal algorithm for practical three-dimensional lithography simulation with experimental verification
-
Sep
-
E. W. Scheckler, N. N. Tam, A. K. Pfau et al., "An efficient volume-removal algorithm for practical three-dimensional lithography simulation with experimental verification," IEEE Trans. Comput.-Aided Design Integr. Circuits Sys., vol. 12, no. 9, pp. 1345-1356, Sep. 1993.
-
(1993)
IEEE Trans. Comput.-Aided Design Integr. Circuits Sys
, vol.12
, Issue.9
, pp. 1345-1356
-
-
Scheckler, E.W.1
Tam, N.N.2
Pfau, A.K.3
-
11
-
-
0032659076
-
A three-dimensional photoresist etching simulator for TCAD
-
Jan
-
I. Karafyllidis, "A three-dimensional photoresist etching simulator for TCAD," Model. Simul. Mater. Sci. Eng., vol. 7, no. 1, pp. 157-167, Jan. 1999.
-
(1999)
Model. Simul. Mater. Sci. Eng
, vol.7
, Issue.1
, pp. 157-167
-
-
Karafyllidis, I.1
-
12
-
-
0035726857
-
On the use of energy minimization for CA based analysis in elasticity
-
Jan
-
P. Hajela and B. Kim, "On the use of energy minimization for CA based analysis in elasticity," Struct. Multidiscpl. Optim., vol. 23, no. 1, pp. 24-33, Jan. 2001.
-
(2001)
Struct. Multidiscpl. Optim
, vol.23
, Issue.1
, pp. 24-33
-
-
Hajela, P.1
Kim, B.2
-
13
-
-
0034151169
-
Structural design using cellular automata
-
Jan
-
E. Kita and T. Toyoda, "Structural design using cellular automata," Struct. Multidiscpl. Optim., vol. 19, no. 1, pp. 64-73, Jan. 2000.
-
(2000)
Struct. Multidiscpl. Optim
, vol.19
, Issue.1
, pp. 64-73
-
-
Kita, E.1
Toyoda, T.2
-
16
-
-
33846260363
-
Empirical test for cellular automaton models of traffic flow
-
Jan
-
K. Wolfgang, S. Ludger, S. Andreas et al., "Empirical test for cellular automaton models of traffic flow," Phys. Rev. E, Stat. Phys. Plasmas Fluids Relat. Interdiscip. Top., vol. 70, no. 1, pp. 1-25, Jan. 2004.
-
(2004)
Phys. Rev. E, Stat. Phys. Plasmas Fluids Relat. Interdiscip. Top
, vol.70
, Issue.1
, pp. 1-25
-
-
Wolfgang, K.1
Ludger, S.2
Andreas, S.3
-
17
-
-
2142641902
-
Cellular automata simulation of nanometer-scale MOSFETs
-
Feb
-
M. Saraniti, G. Zandler, G. Formicone et al., "Cellular automata simulation of nanometer-scale MOSFETs," Semicond. Sci. Technol., vol. 13, no. 2, pp. 177-179, Feb. 1998.
-
(1998)
Semicond. Sci. Technol
, vol.13
, Issue.2
, pp. 177-179
-
-
Saraniti, M.1
Zandler, G.2
Formicone, G.3
-
19
-
-
15544379292
-
A novel 2-D dynamic cellular automata model for photoresist etching process simulation
-
Mar
-
Z. F. Zhou, Q. A. Huang, W. H. Li et al., "A novel 2-D dynamic cellular automata model for photoresist etching process simulation," J. Micromech. Microeng., vol. 15, no. 3, pp. 652-662, Mar. 2005.
-
(2005)
J. Micromech. Microeng
, vol.15
, Issue.3
, pp. 652-662
-
-
Zhou, Z.F.1
Huang, Q.A.2
Li, W.H.3
-
20
-
-
0033717708
-
Micromachining process simulation using a continuous cellular automata method
-
Jun
-
Z. J. Zhu and C. Liu, "Micromachining process simulation using a continuous cellular automata method," J. Microelectromech. Syst., vol. 9, no. 2, pp. 252-261, Jun. 2000.
-
(2000)
J. Microelectromech. Syst
, vol.9
, Issue.2
, pp. 252-261
-
-
Zhu, Z.J.1
Liu, C.2
-
21
-
-
0029378440
-
Simulation of two-dimensional photoresist etching process in integrated circuit fabrication using cellular automata
-
Mar
-
I. Karafyllidis and A. Thanailakis, "Simulation of two-dimensional photoresist etching process in integrated circuit fabrication using cellular automata," Model. Simul. Mater. Sci. Eng., vol. 3, no. 3, pp. 629-642, Mar. 1995.
-
(1995)
Model. Simul. Mater. Sci. Eng
, vol.3
, Issue.3
, pp. 629-642
-
-
Karafyllidis, I.1
Thanailakis, A.2
-
22
-
-
0002931419
-
Modeling and simulation of reaction kinetics in advanced resist processes for optical lithography,
-
Ph.D. dissertation, Univ. California, Berkeley, CA
-
R. A. Ferguson, "Modeling and simulation of reaction kinetics in advanced resist processes for optical lithography," Ph.D. dissertation, Univ. California, Berkeley, CA, 1991.
-
(1991)
-
-
Ferguson, R.A.1
-
23
-
-
33846208899
-
-
private communication, Aug. 17/Oct. 6
-
I. Karafyllidis, private communication, Aug. 17/Oct. 6, 2005.
-
(2005)
-
-
Karafyllidis, I.1
-
24
-
-
33846234042
-
-
private communication, Jul. 29/Aug. 10
-
D. Adalsteinsson and J. A. Sethian, private communication, Jul. 29/Aug. 10, 2005.
-
(2005)
-
-
Adalsteinsson, D.1
Sethian, J.A.2
-
25
-
-
84907705797
-
Advanced hybrid cellular based approach for three-dimensional etching and deposition simulation
-
Athens, Greece
-
A. Hoessinger, T. Binder, W. Pyka et al., "Advanced hybrid cellular based approach for three-dimensional etching and deposition simulation," in Proc. SISPAD, Athens, Greece, 2001, pp. 424-427.
-
(2001)
Proc. SISPAD
, pp. 424-427
-
-
Hoessinger, A.1
Binder, T.2
Pyka, W.3
-
26
-
-
0034852070
-
Towards a universal resist dissolution model for lithography simulation
-
Edinburgh, U.K, Jun
-
S. Roberson, C. A. Mack, and M. Maslow, "Towards a universal resist dissolution model for lithography simulation," in Proc. SPIE-Lithography for Semicond. Manuf., Edinburgh, U.K., Jun. 2001, pp. 111-122.
-
(2001)
Proc. SPIE-Lithography for Semicond. Manuf
, pp. 111-122
-
-
Roberson, S.1
Mack, C.A.2
Maslow, M.3
-
27
-
-
0032630531
-
A parameter extraction framework for DUV lithography simulation
-
San Jose, CA, Jun
-
N. Jakatdar, J. W. Bao, C. J. Spanos et al., "A parameter extraction framework for DUV lithography simulation," in Proc. SPIE - Metrology, Inspection, and Process Control for Microlithography XIII, San Jose, CA, Jun. 1999, pp. 447-456.
-
(1999)
Proc. SPIE - Metrology, Inspection, and Process Control for Microlithography
, vol.13
, pp. 447-456
-
-
Jakatdar, N.1
Bao, J.W.2
Spanos, C.J.3
-
28
-
-
0032404022
-
Characterization of a chemically amplified photoresist for simulation using a modified 'poor man's DRM' methodology
-
Santa Clara, CA, Feb
-
N. Jakatdar, X. H. Niu, and C. J. Spanos, "Characterization of a chemically amplified photoresist for simulation using a modified 'poor man's DRM' methodology," in Proc. SPIE - Metrology, Inspection, and Process Control for Microlithography XII, Santa Clara, CA, Feb. 1998, pp. 578-585.
-
(1998)
Proc. SPIE - Metrology, Inspection, and Process Control for Microlithography
, vol.12
, pp. 578-585
-
-
Jakatdar, N.1
Niu, X.H.2
Spanos, C.J.3
-
29
-
-
85076260894
-
Extension of the Hopkins theory of partially coherent imaging to include thin-film interference effects
-
San Jose, CA, Aug
-
S. Yeung, L. Derek, L. Robert et al., "Extension of the Hopkins theory of partially coherent imaging to include thin-film interference effects," in Proc. SPIE - Opt./Laser Microlithography VI, San Jose, CA, Aug. 1993, pp. 452-463.
-
(1993)
Proc. SPIE - Opt./Laser Microlithography
, vol.6
, pp. 452-463
-
-
Yeung, S.1
Derek, L.2
Robert, L.3
-
30
-
-
0034846063
-
Comparison of simulation approaches for chemically amplified resists
-
Edinburgh, U.K, Apr
-
A. Erdmann, W. Henke, S. Robertson et al., "Comparison of simulation approaches for chemically amplified resists," in Proc. SPIE - Lithography for Semicond. Manuf. II, Edinburgh, U.K., Apr. 2001, pp. 99-110.
-
(2001)
Proc. SPIE - Lithography for Semicond. Manuf
, vol.2
, pp. 99-110
-
-
Erdmann, A.1
Henke, W.2
Robertson, S.3
-
31
-
-
0141498229
-
Practical resist model calibration
-
Santa Clara, CA, Feb
-
P. Baluswamy, A. Weatherly, D. Kewley et al., "Practical resist model calibration," in Proc. SPIE - Opt. Microlithography XVI, Santa Clara, CA, Feb. 2003, pp. 1556-1569.
-
(2003)
Proc. SPIE - Opt. Microlithography
, vol.16
, pp. 1556-1569
-
-
Baluswamy, P.1
Weatherly, A.2
Kewley, D.3
|