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Volumn 13, Issue 8 SUPPL. A, 1998, Pages

Cellular automata simulation of nanometre-scale MOSFETs

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Indexed keywords


EID: 2142641902     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/8A/050     Document Type: Article
Times cited : (4)

References (9)
  • 2
    • 0000703422 scopus 로고
    • Lattice-gas cellular-automaton method for semiclassical transport in semiconductors
    • Kometer K, Zandler G and Vogl P 1992 Lattice-gas cellular-automaton method for semiclassical transport in semiconductors Phys. Rev. B 46 (3) 1382-94
    • (1992) Phys. Rev. B , vol.46 , Issue.3 , pp. 1382-1394
    • Kometer, K.1    Zandler, G.2    Vogl, P.3
  • 7
    • 35949009958 scopus 로고
    • Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects
    • Fischetti M V and Laux S E 1988 Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects Phys. Rev. B 38 (14) 9721-45
    • (1988) Phys. Rev. B , vol.38 , Issue.14 , pp. 9721-9745
    • Fischetti, M.V.1    Laux, S.E.2
  • 8
    • 36449002522 scopus 로고
    • A Monte Carlo simulation of anisotropic electron transport in silicon including full band structure and anisotropic impact-ionization model
    • Kunikiyo T, Takenaka M, Kamakura Y, Yamaji M, Mizuno H, Morifuji M, Taniguchi K and Hamaguchi C 1994 A Monte Carlo simulation of anisotropic electron transport in silicon including full band structure and anisotropic impact-ionization model J. Appl. Phys. 75 (1) 297-312
    • (1994) J. Appl. Phys. , vol.75 , Issue.1 , pp. 297-312
    • Kunikiyo, T.1    Takenaka, M.2    Kamakura, Y.3    Yamaji, M.4    Mizuno, H.5    Morifuji, M.6    Taniguchi, K.7    Hamaguchi, C.8
  • 9
    • 0031079417 scopus 로고    scopus 로고
    • Scaling theory for cylindrical, fully-depleted, surrounding-gate MOSFET's
    • Auth C P and Plummer J D 1997 Scaling theory for cylindrical, fully-depleted, surrounding-gate MOSFET's IEEE Electron Device Letters 18 (2) 74-6
    • (1997) IEEE Electron Device Letters , vol.18 , Issue.2 , pp. 74-76
    • Auth, C.P.1    Plummer, J.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.