-
2
-
-
0026376187
-
Predicting plated-through-hole reliability in high-temperature manufacturing process
-
Iannuzzelli, R., "Predicting Plated-Through-Hole Reliability in High-Temperature Manufacturing Process," Proc. of 41st Electronic Components and Technology conf., 1991, pp. 410-421.
-
(1991)
Proc. of 41st Electronic Components and Technology Conf.
, pp. 410-421
-
-
Iannuzzelli, R.1
-
4
-
-
0029235549
-
A thermo-mechanical fatigue analysis of high density interconnect vias
-
Prabhu, A.S., Barker, D.B, and M.G. Pecht, 1995, "A Thermo-Mechanical Fatigue Analysis of High Density Interconnect Vias," ASME Advances in ElectronicPackaging, Vol. 10-1, pp. 187-216.
-
(1995)
ASME Advances in ElectronicPackaging
, vol.10
, Issue.1
, pp. 187-216
-
-
Prabhu, A.S.1
Barker, D.B.2
Pecht, M.G.3
-
5
-
-
0031645508
-
Thermal fatigue analysis of a CBGA package with lead free solder fillets
-
Bor Zen Hong, "Thermal Fatigue Analysis of a CBGA Package with Lead free Solder Fillets", 1998 InterSociety Conference on Thermal Phenomena, pp. 205-211.
-
1998 InterSociety Conference on Thermal Phenomena
, pp. 205-211
-
-
Bor, Z.H.1
-
6
-
-
4444309240
-
Lead-free 95.SSn-3.8Ag-0.7Cu solder joint reliability analysis for micro-BGA assembly
-
John. H.L. Pang, Patrick T.H. Low, B.S. Xiong, "Lead-Free 95.SSn-3.8Ag-0.7Cu Solder Joint Reliability Analysis For Micro-BGA Assembly", Inter Society Conference on thermal phenomena, pp. 131-136, 2004.
-
(2004)
Inter Society Conference on Thermal Phenomena
, pp. 131-136
-
-
Pang, J.H.L.1
Low, P.T.H.2
Xiong, B.S.3
-
7
-
-
33746494984
-
Impact of different flip-chip bump materials on bump temperature rise and package reliability
-
Irvine, California, March 18-21
-
David S. Chau, Ashish Gupta, Chia-Pin Chiu, Suzana Prstic, Seth Reynolds, "Impact of Different Flip-Chip Bump Materials on Bump Temperature Rise and Package Reliability," Proceedings, International Symposium on Advanced Packaging Materials, Irvine, California, 2005, March 18-21.
-
(2005)
Proceedings, International Symposium on Advanced Packaging Materials
-
-
Chau, D.S.1
Gupta, A.2
Chiu, C.-P.3
Prstic, S.4
Reynolds, S.5
-
9
-
-
0024925511
-
Multichip assembly with flipped integrated circuits
-
Dec.
-
K. Gail Heinen, Walter H. Schroen, Darvin R. Edwards, Arthur M. Wilson, Roger J. Stierman, and Michael A. Lamson, "Multichip Assembly with Flipped Integrated Circuits," IEEE Trans, on Compon, Hybrids, and Manuf. Technol., vol. 12, no. 4, Dec. 1989.
-
(1989)
IEEE Trans, on Compon, Hybrids, and Manuf. Technol.
, vol.12
, Issue.4
-
-
Gail Heinen, K.1
Schroen, W.H.2
Edwards, D.R.3
Wilson, A.M.4
Stierman, R.J.5
Lamson, M.A.6
-
10
-
-
0033715475
-
-
May
-
T Kawahara, "SuperCSPTM," Trans. Adv. Packag., vol. 23, no. 2, pp. 215-219, May 2000.
-
(2000)
"SuperCSPTM," Trans. Adv. Packag.
, vol.23
, Issue.2
, pp. 215-219
-
-
Kawahara, T.1
-
11
-
-
33845590180
-
Numerical analysis on compliance and electrical behavior of multi-copper-column flip-chip interconnects for wafer-level packaging
-
E. B. Liao, Andrew A. O. Tay, Simon S. Ang, H. H. Feng, R. Nagarajan, and V. Kripesh, "Numerical Analysis on Compliance and Electrical Behavior of Multi-Copper-Column Flip-Chip Interconnects for Wafer-Level Packaging," IEEE Trans. on Advan. Packag., pp. 1-11, 2005.
-
(2005)
IEEE Trans. on Advan. Packag.
, pp. 1-11
-
-
Liao, E.B.1
Tay, A.A.O.2
Ang, S.S.3
Feng, H.H.4
Nagarajan, R.5
Kripesh, V.6
-
13
-
-
10444251749
-
Reliability of lead-free copper columns in comparison with tin-lead solder column interconnects
-
S. B. Park, Rahul Joshi, and Lewis Goldmann, "Reliability of Lead-Free Copper Columns in Comparison with Tin-Lead Solder Column Interconnects," Electronic Components and Technology Conference, pp. 82-89, 2004.
-
(2004)
Electronic Components and Technology Conference
, pp. 82-89
-
-
Park, S.B.1
Joshi, R.2
Goldmann, L.3
-
14
-
-
24644509863
-
Optimization of copper column based solder bump design for high reliability flip-chip interconnections
-
Hiroshi Yamada, Takashi Togasaki, "Optimization of Copper Column Based Solder Bump Design for High Reliability Flip-Chip Interconnections", Proceedings, Electronic Components and Technology Conference, 2005, pp. 94-99.
-
(2005)
Proceedings, Electronic Components and Technology Conference
, pp. 94-99
-
-
Yamada, H.1
Togasaki, T.2
-
15
-
-
24644488936
-
Assembly and reliability assessment of lithography-based wafer-level compliant chip-to-substrate interconnects
-
Karan Kacker, Geoge Lo and Suresh Sitaraman, "Assembly and Reliability Assessment of Lithography-Based Wafer-Level Compliant Chip-to-Substrate Interconnects", Proceedings, Electronic Components and Technology Conference, 2005, pp. 545-550.
-
(2005)
Proceedings, Electronic Components and Technology Conference
, pp. 545-550
-
-
Kacker, K.1
Lo, G.2
Sitaraman, S.3
-
16
-
-
15744399371
-
Design and analysis of wafer-level CSP with a double-pad structure
-
march
-
Ji-Cheng Lin, Hsien-Chie Cheng, and Kuo-Ning Chiang, "Design and Analysis of Wafer-Level CSP With a Double-Pad Structure", IEEE Transactions on Components and Packaging Technologies, vol. 28, no. 1, march 2005.
-
(2005)
IEEE Transactions on Components and Packaging Technologies
, vol.28
, Issue.1
-
-
Lin, J.-C.1
Cheng, H.-C.2
Chiang, K.-N.3
-
17
-
-
0012040420
-
Laser-assisted bump transfer for flip chip assembly
-
C. H. Wang, A. S. Holmes, and S. Gao, "Laser-Assisted Bump transfer for Flip Chip Assembly," Int'l Symp. On Electronic Materials & Packaging, pp. 86-90, 2000.
-
(2000)
Int'l Symp. on Electronic Materials & Packaging
, pp. 86-90
-
-
Wang, C.H.1
Holmes, A.S.2
Gao, S.3
-
18
-
-
14844320107
-
A low cost bumping method for flip chip assembly and MEMS integration
-
J. H Zhang, C. H. Wang, A. J. Pang and J. Zeng, "A low cost bumping method for flip chip assembly and MEMS integration," Proceedings of HDP, pp. 171-176, 2004.
-
(2004)
Proceedings of HDP
, pp. 171-176
-
-
Zhang, J.H.1
Wang, C.H.2
Pang, A.J.3
Zeng, J.4
-
19
-
-
2342558037
-
Novel low-cost sol-gel derived nano-structured and repairable interconnects
-
Boston, MA, November, 2003
-
Ankur O. Aggarwal, I R Abothu, P. Markondeya Raj, M. D. Sacks, Rao R. Tummala, "Novel Low-Cost Sol-Gel Derived Nano-structured and Repairable Interconnects", Proceedings, International Microelectronics and Packaging Society, 2003, pp. 943-949, Boston, MA, November, 2003.
-
(2003)
Proceedings, International Microelectronics and Packaging Society
, pp. 943-949
-
-
Aggarwal, A.O.1
Abothu, I.R.2
Markondeya Raj, P.3
Sacks, M.D.4
Tummala, R.R.5
-
20
-
-
10444270955
-
Nanocrystalline copper and nickel as ultra high-density chip-to-package interconnections
-
IEEE, Piscataway, NJ
-
Shubhra Bansal, Ashok Saxena and Rao Tummala, "Nanocrystalline Copper and Nickel as Ultra High-Density Chip-to-Package Interconnections", Proceedings, 54th Electronic Components and Technology Conference, IEEE, Piscataway, NJ, 2004, p. 1646-1651.
-
(2004)
Proceedings, 54th Electronic Components and Technology Conference
, pp. 1646-1651
-
-
Bansal, S.1
Saxena, A.2
Tummala, R.3
-
21
-
-
84954049396
-
Low temperature sintering process for deposition of nanostructured metal for nano IC packaging
-
IEEE, Piscataway, NJ
-
th Electronics Packaging Technology Conference, IEEE, Piscataway, NJ, (2003), p. 551-556.
-
(2003)
th Electronics Packaging Technology Conference
, pp. 551-556
-
-
Kong, W.K.1
Kripesh, V.2
Gupta, M.K.3
Tay, A.A.O.4
Tummala, R.R.5
-
22
-
-
0035855003
-
Fabrication of highly ordered metallic nanowire arrays by electrodeposition
-
A. J. Yin, J. Li, W. Jian, A. J. Bennett and J. M. Xu, " Fabrication of Highly Ordered Metallic Nanowire arrays by Electrodeposition", Appl. Phys. Lett. Vol. 79(2001), pp1039-1041
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 1039-1041
-
-
Yin, A.J.1
Li, J.2
Jian, W.3
Bennett, A.J.4
Xu, J.M.5
-
23
-
-
10444264482
-
MEMS composite structures for tunable capacitors and wafer-level nanointerconnects
-
Las Vegas, Nevada
-
Ankur O. Aggarwal, Kianoush Naeli, P. Markondeya Raj, Farrokh Ayazi, Swapan Bhattacharya, and Rao Tummala, "MEMS composite structures for tunable capacitors and wafer-level nanointerconnects", Proceedings, Electronic Components and Technology Conference, 2004, Las Vegas, Nevada, pp. 835-842.
-
(2004)
Proceedings, Electronic Components and Technology Conference
, pp. 835-842
-
-
Aggarwal, A.O.1
Naeli, K.2
Markondeya Raj, P.3
Ayazi, F.4
Bhattacharya, S.5
Tummala, R.6
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