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Volumn , Issue , 2005, Pages 207-212

Soft error mitigation for SRAM-based FPGAs

Author keywords

[No Author keywords available]

Indexed keywords

ASIC DESIGN; MITIGATION TECHNIQUES; ORDERS OF MAGNITUDE; PERMANENT ERRORS; SINGLE EVENT UPSETS; SOFT ERROR MITIGATIONS;

EID: 33845594463     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.75     Document Type: Conference Paper
Times cited : (58)

References (21)
  • 13
    • 84936893976 scopus 로고
    • Using heavy-ion radiation to validate fault handling mechanisms
    • Feb
    • J. Karlsson, P. Ledan, P. Dahlgren, and R. Johansson, "Using Heavy-Ion Radiation to Validate Fault Handling Mechanisms," IEEE Micro, 14(1), pp. 8-23, Feb. 1994.
    • (1994) IEEE Micro , vol.14 , Issue.1 , pp. 8-23
    • Karlsson, J.1    Ledan, P.2    Dahlgren, P.3    Johansson, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.