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Volumn 2438 LNCS, Issue , 2002, Pages 607-615
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Simulation-based analysis of SEU effects on SRAM-based FPGAs
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGED PARTICLES;
COMPUTATION THEORY;
COMPUTER CONTROL SYSTEMS;
COSTS;
RADIATION EFFECTS;
RECONFIGURABLE ARCHITECTURES;
SOFTWARE TESTING;
STATIC RANDOM ACCESS STORAGE;
BENCHMARK CIRCUIT;
CONFIGURATION MEMORY;
FAULT INJECTION;
LOW COSTS;
RADIATION TESTING;
SIMULATION-BASED ANALYSIS;
SRAM-BASED FPGA;
FIELD PROGRAMMABLE GATE ARRAYS (FPGA);
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EID: 79955133275
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/3-540-46117-5_63 Document Type: Conference Paper |
Times cited : (28)
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References (12)
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