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Volumn 83, Issue 11-12, 2006, Pages 2462-2468

Assembly and reliability of PBGA packages on FR-4 PCBs with SnAgCu solder

Author keywords

Joint dimensions; Microstructure; Reliability; SnAgCu solder joints; Thermal cycling

Indexed keywords

INTERMETALLICS; MICROELECTRONICS; MICROSTRUCTURE; PRINTED CIRCUIT BOARDS; RELIABILITY; SOLDERED JOINTS; THERMAL CYCLING;

EID: 33751213416     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2006.05.002     Document Type: Article
Times cited : (28)

References (35)
  • 23
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    • NIST, National Institute of Standards and Technology database, Phase Diagrams & Computational Thermodynamics. , 2004 (accessed 12.09.04).
  • 24
    • 27644448255 scopus 로고    scopus 로고
    • A. Anand, Y.C. Mui, in: Proceedings of the 4th IEEE Electronic Packaging Technology Conference, Singapore, 2002, p. 6-10.
  • 25
    • 0034480250 scopus 로고    scopus 로고
    • L.L. Ye, Z. Lai, J. Liu, A. Tholen, in: Proceedings of the 50th IEEE Electronic Components and Technology Conference, Las Vegas, USA, 2000, p. 134-137.
  • 27
    • 33751230995 scopus 로고    scopus 로고
    • G.R. Minogue, in: Proceedings of the Technical Conference of IPC Printed Circuits Expo (APEX 2002), San Diego, CA, 2002, S06 3.1-3.6.
  • 28
    • 33751227711 scopus 로고    scopus 로고
    • IPC/EIA, Requirements for Soldering Fluxes, IPC/EIA J-STD-004A, EIA, Arlington, VA and IPC, Northbrook, IL, 1996.
  • 29
    • 33751242377 scopus 로고    scopus 로고
    • JEDEC Solid State Technology Association, JEDEC Standard BGA Ball Shear, JESD22-B117, EIA, Arlington, VA, 2000.
  • 30
    • 33751226168 scopus 로고    scopus 로고
    • IPC, IPC-TM-650 Test Methods Manual, IPC/EIA J-STD-004A, IPC, Northbrook, IL, 1995.
  • 32
    • 33751218791 scopus 로고    scopus 로고
    • S.O. Dunford, A. Primavera, M. Meilunas, Microstructural evolution and damage mechanisms in Pb-free solder joints during extended -40 °C to 125 °C thermal cycles, Technical article, IPC Review Magazines, December 2002, 8-9, and January 2003, 10-11.
  • 33
    • 33751256760 scopus 로고    scopus 로고
    • P. Roubaud, G. Ng, G. Henshall, R. Bulwith, R. Herber, S. Prasad, in: Proceedings of the Technical Conference of IPC Printed Circuits Expo (APEX 2002), San Diego, CA, 2002, LF2-3.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.