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Volumn 15, Issue 2, 2003, Pages 46-52

Study of under bump metallisation barrier layer for lead-free solder

Author keywords

Lead free; Under bump metallurgy

Indexed keywords

COPPER; ELECTROPLATING; LEAD; METALLIZING; NICKEL; RELIABILITY;

EID: 0037591574     PISSN: 09540911     EISSN: None     Source Type: Journal    
DOI: 10.1108/09540910310479521     Document Type: Article
Times cited : (21)

References (15)
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    • Chan, Y.C., Tu, P.L., So, A.C.K. and Lai, J.K.L. (1997), "Effect of intermetallic compounds on the shear fatigue of Cu/63Sn-37Pb solder joints", Trans, of IEEE CPMT-PartB, Vol. 20 No. 4, pp. 463-8.
    • (1997) Trans, of IEEE CPMT-PartB , vol.20 , Issue.4 , pp. 463-468
    • Chan, Y.C.1    Tu, P.L.2    So, A.C.K.3    Lai, J.K.L.4
  • 6
    • 0242264129 scopus 로고    scopus 로고
    • The role of intermetallic compounds in lead-free soldering
    • Harris, P.G. and Chaggar, K.S. (1998), "The role of intermetallic compounds in lead-free soldering", Soldering and Surface Mount Technology, Vol. 10 No. 3, pp. 38-52.
    • (1998) Soldering and Surface Mount Technology , vol.10 , Issue.3 , pp. 38-52
    • Harris, P.G.1    Chaggar, K.S.2
  • 7
    • 0032182488 scopus 로고    scopus 로고
    • Eutectic Sn/Pb solder bump and under bump metallurgy: Interfacial reactions and adhesion
    • Jang, S.Y. and Paik, K.W. (1998), "Eutectic Sn/Pb solder bump and under bump metallurgy: interfacial reactions and adhesion", Soldering and Surface Mount Technology, Vol. 10 No. 3, pp. 29-37.
    • (1998) Soldering and Surface Mount Technology , vol.10 , Issue.3 , pp. 29-37
    • Jang, S.Y.1    Paik, K.W.2
  • 8
    • 0038430021 scopus 로고    scopus 로고
    • Moisture/reflow sensitivity classification for nonhermatic solid state surface mount devices
    • JEDEC (1999), "Moisture/reflow sensitivity classification for nonhermatic solid state surface mount devices", IPC/JEDEC Joint Standard No. 020A, http://www.jedec.org/download/search/jstd020a.pdf
    • (1999) IPC/JEDEC Joint Standard No. 020A , vol.20 A
  • 9
    • 0037753600 scopus 로고
    • Temperature cycling
    • JESD
    • JESD (1989), "Temperature cycling", JESD Standard No. 22-A104-A Level G, http://www.jedec.ord/download/search/22al04a.pdf
    • (1989) JESD Standard No. 22-A104-A Level G
  • 10
    • 0000072496 scopus 로고    scopus 로고
    • Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening
    • Kim, H.K. and Tu, K.N. (1996), "Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening", Physical Review B, Vol. 53 No. 23, pp. 16027-34.
    • (1996) Physical Review B , vol.53 , Issue.23 , pp. 16027-16034
    • Kim, H.K.1    Tu, K.N.2
  • 11
  • 13
    • 0002013545 scopus 로고    scopus 로고
    • Effect of dissolution and intermetallic formation on the reliability of FC joints
    • Kulojarvi, K., Vuorinen, V. and Kivilahti, J. (1998), "Effect of dissolution and intermetallic formation on the reliability of FC joints", Microelectronics International, Vol. 15 No. 2, pp. 20-4.
    • (1998) Microelectronics International , vol.15 , Issue.2 , pp. 20-24
    • Kulojarvi, K.1    Vuorinen, V.2    Kivilahti, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.