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Volumn 13, Issue 2, 2001, Pages 21-25

Reliability of FCOB with and without encapsulation

Author keywords

Encapsulation; Eutectic solder; Flip chip; Reliability

Indexed keywords

CERAMIC MATERIALS; ENCAPSULATION; EUTECTICS; HIGH TEMPERATURE TESTING; PRINTED CIRCUIT BOARDS; SOLDERING ALLOYS; THERMAL CYCLING; TIN ALLOYS;

EID: 0034991303     PISSN: 09540911     EISSN: None     Source Type: Journal    
DOI: 10.1108/09540910110385211     Document Type: Article
Times cited : (16)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.