PEAKASO: Peak-temperature aware scan-vector optimization

Proceedings of the IEEE VLSI Test Symposium

Volumn 2006, Issue , 2006, Pages 52-57

  Cho, Minsik ^a   Pan, David Z ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PRECOMPENSATION; SCAN-VECTOR OPTIMIZATION; THERMAL GRADIENT; WINDOW-BASED POWER ANALYSIS;

BUILT-IN SELF TEST; ELECTRIC NETWORK ANALYSIS; ELECTRIC POWER UTILIZATION; HEAT LOSSES; VECTORS;

ALGORITHMS;

EID: 33751116341     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.56     Document Type: Conference Paper

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