Low power testing of VLSI circuits: Problems and solutions

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2000-January, Issue , 2000, Pages 173-179

  Girard, Patrick ^a  

^a LIRMM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY UTILIZATION; INTEGRATED CIRCUIT TESTING; LOW POWER ELECTRONICS; NONDESTRUCTIVE EXAMINATION; SURVEYS; VLSI CIRCUITS;

CIRCUIT RELIABILITY; FUNCTIONAL TESTING; NON DESTRUCTIVE TESTING; PERFORMANCE VERIFICATION; POWER AND ENERGY CONSUMPTION; PROBLEMS AND SOLUTIONS; STATE-OF-THE-ART TECHNIQUES; TEST APPLICATIONS;

BUILT-IN SELF TEST;

EID: 84950145296     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2000.838871     Document Type: Conference Paper

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