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Volumn 11, Issue 4, 2006, Pages 848-879

Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters

Author keywords

Process variation; Spatial correlation; Statistical timing analysis

Indexed keywords


EID: 33750969691     PISSN: 10844309     EISSN: 10844309     Source Type: Journal    
DOI: 10.1145/1179461.1179464     Document Type: Article
Times cited : (18)

References (26)
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  • 9
    • 0001310038 scopus 로고
    • The Greatest of a Finite Set of Random Variable
    • CLARK, C. E. 1961. The Greatest of a Finite Set of Random Variable, vol. 9. Operations Research, 85-91.
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    • Clark, C.E.1
  • 15
    • 0027614893 scopus 로고
    • Statistical timing analysis of combinational logic circuits
    • JYU, H. F., MALIK, S., DEVADAS, S., AND KEUTZER, K. W. 1993. Statistical timing analysis of combinational logic circuits. IEEE Trans. VLSI Syst. 1, 126-137.
    • (1993) IEEE Trans. VLSI Syst. , vol.1 , pp. 126-137
    • Jyu, H.F.1    Malik, S.2    Devadas, S.3    Keutzer, K.W.4
  • 22
    • 0026106011 scopus 로고
    • Delay analysis of series-connected MOSFET circuits
    • SAKURAI, T. AND NEWTON, R. 1991. Delay analysis of series-connected MOSFET circuits. IEEE J. Solid-State Circ., 122-131.
    • (1991) IEEE J. Solid-state Circ. , pp. 122-131
    • Sakurai, T.1    Newton, R.2
  • 23
    • 0031365880 scopus 로고    scopus 로고
    • Intrinsic MOSFET parameter fluctuations due to random dopant placement
    • TANG, X., DE, V., AND MEINDL, J. D. 1997. Intrinsic MOSFET parameter fluctuations due to random dopant placement. IEEE Trans. VLSI Syst. 5, 369-376.
    • (1997) IEEE Trans. VLSI Syst. , vol.5 , pp. 369-376
    • Tang, X.1    De, V.2    Meindl, J.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.