-
1
-
-
84884698255
-
Optimization of Vdd and Vth for low-power and high-speed application
-
K. Nose and T. Sakurai, "Optimization of Vdd and Vth for Low-Power and High-Speed Application," ASP-DAC, 2000.
-
(2000)
ASP-DAC
-
-
Nose, K.1
Sakurai, T.2
-
4
-
-
0042635808
-
Death, taxes and failing chips
-
C. Visweswariah, "Death, taxes and failing chips," DAC, 2003.
-
(2003)
DAC
-
-
Visweswariah, C.1
-
6
-
-
0036911849
-
Sub-90 nm technologies challenges and opportunities for CAD
-
T. Karnik, S. Borkar, and V. De, "Sub-90 nm technologies challenges and opportunities for CAD," ICCAD, 2002.
-
(2002)
ICCAD
-
-
Karnik, T.1
Borkar, S.2
De, V.3
-
8
-
-
0036916414
-
Methods for true power minimization
-
R. Brodersen et al., "Methods for True Power Minimization," ICCAD, 2002.
-
(2002)
ICCAD
-
-
Brodersen, R.1
-
9
-
-
0036953966
-
Unified methodology for resolving power-performance tradeoffs at the microarchitectural and circuit level
-
V. Zyuban and P. Strenski, "Unified Methodology for Resolving Power-Performance Tradeoffs at the Microarchitectural and Circuit Level," ISLPED, 2002.
-
(2002)
ISLPED
-
-
Zyuban, V.1
Strenski, P.2
-
10
-
-
3843068759
-
Methods for true energy-performance optimization
-
Aug.
-
D. Markovic et al., "Methods for true energy-performance optimization," IEEE J. Solid-State Circuits, Aug. 2004.
-
(2004)
IEEE J. Solid-state Circuits
-
-
Markovic, D.1
-
11
-
-
27944464454
-
Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance
-
A. Srivastava et al, "Accurate and Efficient Gate-Level Parametric Yield Estimation Considering Correlated Variations in Leakage Power and Performance," DAC, 2005.
-
(2005)
DAC
-
-
Srivastava, A.1
-
12
-
-
17644377645
-
A new statistical optimization algorithm for gate sizing
-
M. Mani and M. Orshansky, "A New Statistical Optimization Algorithm for Gate Sizing," ICCD, 2004
-
(2004)
ICCD
-
-
Mani, M.1
Orshansky, M.2
-
13
-
-
27944441297
-
An efficient algorithm for statistical minimization of total power under timing yield constraints
-
M. Mani, A. Devgan, and M. Orshansky, "An efficient algorithm for statistical minimization of total power under timing yield constraints," DAC, 2005.
-
(2005)
DAC
-
-
Mani, M.1
Devgan, A.2
Orshansky, M.3
-
16
-
-
0022231945
-
TILOS: A posynomial programming approach to transistor sizing
-
J. P. Fishburn and A. E. Dunlop, "TILOS: A posynomial programming approach to transistor sizing," ICCAD, 1985.
-
(1985)
ICCAD
-
-
Fishburn, J.P.1
Dunlop, A.E.2
-
17
-
-
34249996011
-
A framework for design space exploration of parameterized VLSI systems
-
G. Ascia, V. Catania, and M. Palesi, "A Framework for Design Space Exploration of Parameterized VLSI Systems," VLSI Design, 2002.
-
(2002)
VLSI Design
-
-
Ascia, G.1
Catania, V.2
Palesi, M.3
-
18
-
-
1242265352
-
Using Pearson correlation to improve envelopes around the distributions of functions
-
D. Berleant and J. Zhang, "Using Pearson correlation to improve envelopes around the distributions of functions," Reliable Computing, 10(2), pp. 139-161, 2004.
-
(2004)
Reliable Computing
, vol.10
, Issue.2
, pp. 139-161
-
-
Berleant, D.1
Zhang, J.2
-
19
-
-
33750902753
-
Static timing analysis based on partial and distribution-free probabilistic descriptions of delay uncertainty
-
W. S. Wang, V. Kreinovich, and M. Orshansky, "Static Timing Analysis Based on Partial and Distribution-Free Probabilistic Descriptions of Delay Uncertainty," Timing Analysis Workshop, 2006.
-
(2006)
Timing Analysis Workshop
-
-
Wang, W.S.1
Kreinovich, V.2
Orshansky, M.3
|