On the selection of efficient arithmetic additive test pattern generators [logic test]

Proceedings of the European Test Workshop

Volumn 2003-January, Issue , 2003, Pages 9-14

  Manich, S ^a   Garcia, L ^a   Balado, L ^a   Lupon, E ^a   Rius, J ^a   Rodriguez, R ^a   Figueras, J ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

Additives; Arithmetic; Automatic test equipment; Automatic testing; Built in self test; Circuit faults; Circuit testing; Greedy algorithms; Random number generation; Test pattern generators

Indexed keywords

ADDITIVES; AUTOMATIC TEST PATTERN GENERATION; AUTOMATIC TESTING; DIGITAL ARITHMETIC; ELECTRIC GENERATORS; EQUIPMENT TESTING; INTEGRATED CIRCUIT TESTING; RANDOM NUMBER GENERATION;

AUTOMATIC TEST EQUIPMENT; CIRCUIT FAULTS; CIRCUIT TESTING; GREEDY ALGORITHMS; TEST PATTERN GENERATOR;

BUILT-IN SELF TEST;

EID: 33750585618     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2003.1231662     Document Type: Conference Paper

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