|
|
|
Volumn , Issue , 1999, Pages 499-508
|
|
Testing a system-on-a-chip with embedded microprocessor
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
BINARY CODES;
BUILT-IN SELF TEST;
COMPUTATIONAL COMPLEXITY;
DATA STORAGE EQUIPMENT;
DESIGN FOR TESTABILITY;
DIGITAL TO ANALOG CONVERSION;
EMBEDDED SYSTEMS;
MICROPROCESSOR CHIPS;
PROGRAM ASSEMBLERS;
ASSEMBLY LANGUAGE;
EMBEDDED MEMORIES;
MICROPROCESSOR CORE;
SYSTEM ON CHIP;
INTEGRATED CIRCUIT TESTING;
|
|
EID: 0033307908
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
|
Times cited : (35)
|
|
References (13)
|
