Non-intrusive BIST for systems-on-a-chip

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 644-651

  Chiusano, Silvia ^a   Prinetto, Paolo ^a   Wunderlich, Hans Joachim ^b  

^a POLITECNICO DI TORINO   (Italy)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

C (PROGRAMMING LANGUAGE); COMPUTER SIMULATION; GENETIC ALGORITHMS; MICROPROCESSOR CHIPS; SHIFT REGISTERS;

ARITHMETIC LOGIC UNIT; DETERMINISTIC TEST PATTERN GENERATOR; RESEEDING METHOD; SYSTEMS-ON-A-CHIP;

BUILT-IN SELF TEST;

EID: 0034476674     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2000.894259     Document Type: Article

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