Test length reduction for accumulator-based self-test

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 1997, Pages 2705-2708

  Mayer, Frank ^a   Stroele, Albrecht P ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; ALGORITHMS; CALCULATIONS; FAILURE ANALYSIS; OPTIMIZATION; POLYNOMIALS; SHIFT REGISTERS;

ARITHMETIC PATTERN GENERATORS; BUILT IN SELF TEST; CELLULAR AUTOMATA; LINEAR FEEDBACK SHIFT REGISTERS;

INTEGRATED CIRCUIT TESTING;

EID: 0030660819     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)