Trends in SLI design and their effect on test

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 628-637

  Aitken, Robert ^a   Muradali, Fidel ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; COMPUTER AIDED DESIGN; ELECTRON DEVICE MANUFACTURE; FLOWCHARTING; TRANSISTORS;

NON RECURRING ENGINEERING; SYSTEM LEVEL INTEGRATION; TEST EXECUTION;

DESIGN FOR TESTABILITY;

EID: 0033332425     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)