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Volumn , Issue , 1999, Pages 238-242

Validation and test of systems on chip: A case study

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; EMBEDDED SYSTEMS; SYSTEM-ON-CHIP;

EID: 3142748928     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASIC.1999.806512     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 8
    • 85040630827 scopus 로고
    • Evaluation del disefio de modulos parametriza-blcs de memoria RAM autotestablcs mediante el mctodo de Kinoshita-Saluja
    • Barcelona
    • E. Lup6n, L, Balado, "Evaluation del disefio de modulos parametriza-blcs de memoria RAM autotestablcs mediante el mctodo de Kinoshita-Saluja", in Proc. IV Jornadas de Disefio Ldgico, Barcelona, 1987, pp B9-9G.
    • (1987) Proc. IV Jornadas de Disefio Ldgico , pp. B9-9G
    • Lupon, E.1    Balado, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.