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Volumn 9, Issue 12, 2006, Pages 347-350

A poly-Si thin-film transistor with the in situ vacuum gaps under the T-shaped-gated electrode

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ENCAPSULATION; IN SITU PROCESSING; LEAKAGE CURRENTS; THIN FILMS; TRANSISTORS; VACUUM;

EID: 33750459850     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2357985     Document Type: Article
Times cited : (10)

References (25)
  • 15
    • 33750457397 scopus 로고
    • K. Suzuki, in Technical Digest of SID 1992, p. 39 (1992).
    • (1992) , pp. 39
    • Suzuki, K.1
  • 22
    • 33750430684 scopus 로고    scopus 로고
    • ISE-TCAD User's Manual, Release 8.5, Synopsys, Inc.
    • ISE-TCAD User's Manual, Release 8.5, Synopsys, Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.