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Volumn 20, Issue 9, 1999, Pages 476-477

Self-aligned offset polysilicon thin-film transistor using photoresist reflow

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; PHOTORESISTS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0032595844     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.784457     Document Type: Article
Times cited : (14)

References (8)
  • 2
    • 0023851207 scopus 로고
    • Characteristics of offset-structure polycrystalline-silicon thin-film transistors
    • K. Tanaka, H. Arai, and S. Kohda, "Characteristics of offset-structure polycrystalline-silicon thin-film transistors," IEEE Electron Device Lett., vol. 9, p. 23, 1988.
    • (1988) IEEE Electron Device Lett. , vol.9 , pp. 23
    • Tanaka, K.1    Arai, H.2    Kohda, S.3
  • 4
    • 0026998978 scopus 로고
    • Inverted thin-film transistors with a simple self-aligned lightly doped drain structure
    • C. T. Liu, C. H. D. Yu, A. Kornblit, and K. H. Lee, "Inverted thin-film transistors with a simple self-aligned lightly doped drain structure," IEEE Trans. Electron Devices, vol. 39, p. 2803, 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 2803
    • Liu, C.T.1    Yu, C.H.D.2    Kornblit, A.3    Lee, K.H.4
  • 6
    • 0024684021 scopus 로고
    • Drain-engineered hot-electron-resistant device structures: A Review
    • J. J. Sanchez, K. K. Hsueh, and T. A. DeMassa, "Drain-engineered hot-electron-resistant device structures: A Review," IEEE Trans. Electron Devices, vol. 36, p. 1125, 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 1125
    • Sanchez, J.J.1    Hsueh, K.K.2    DeMassa, T.A.3
  • 7
    • 0024870482 scopus 로고
    • Physical mechanisms for short-channel effects in polysilicon thin-film transistors
    • A. G. Lewis, T. Y. Huang, I. W. Wu, R. H. Bruce, and A. Chiang, "Physical mechanisms for short-channel effects in polysilicon thin-film transistors," in IEDM Tech. Dig., 1989, p. 349.
    • (1989) IEDM Tech. Dig. , pp. 349
    • Lewis, A.G.1    Huang, T.Y.2    Wu, I.W.3    Bruce, R.H.4    Chiang, A.5
  • 8
    • 0026151511 scopus 로고
    • Avalanche-induced effects in polysilicon thin-film transistors
    • M. Hack and A. G. Lewis, "Avalanche-induced effects in polysilicon thin-film transistors," IEEE Electron Device Lett., vol. 12, p. 203, 1991.
    • (1991) IEEE Electron Device Lett. , vol.12 , pp. 203
    • Hack, M.1    Lewis, A.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.