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Volumn 100, Issue 7, 2006, Pages

Gaseous scintillation detection and amplification in variable pressure scanning electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON CASCADES; GASEOUS SCINTILLATION DETECTION (GSD); GASEOUS SCINTILLATION SIGNALS; SECONDARY ELECTRON (SE);

EID: 33750027425     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2355539     Document Type: Article
Times cited : (8)

References (79)
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    • (1992) Secondary-electron Imaging by Scintillating Gaseous Detection Device , pp. 1302-1303
    • Danilatos, G.D.1
  • 48
    • 0002991765 scopus 로고
    • edited by L.Fiermans, J.Vennik, and W.Dekeyser (Plenum, New York
    • H. D. Hagstrum, in Electron and Ion Spectroscopy of Solids, edited by, L. Fiermans, J. Vennik, and, W. Dekeyser, (Plenum, New York, 1978), pp. 273-323.
    • (1978) Electron and Ion Spectroscopy of Solids , pp. 273-323
    • Hagstrum, H.D.1
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    • FEI-Philips, Eindhoven.
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    • EG&G Ortec, Oak Ridge, Tennessee.
    • EG&G Ortec, Oak Ridge, Tennessee.
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    • Ocean Optics Inc., Dunedin, Florida.
    • Ocean Optics Inc., Dunedin, Florida.
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    • Keithley Instruments, Inc., Cleveland, Ohio.
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    • D. C. Joy, http://web.utk.edu/~srcutk/database.doc (2001).
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    • Proceedings of the Fourth Conference on X-Ray Optics and Microanalysis, edited by R.Castaing (Hermann, Paris
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    • ORIGIN®, 7 SR1 v7.03 (B300), OriginLab Corporation, Northhampten, Massachusetts
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.