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Volumn 22, Issue 20, 2006, Pages 8532-8541

Formation mechanisms and properties of semifluorinated molecular gradients on silica surfaces

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR GRADIENTS; SFO MOLECULES; SILICA SURFACES; X-RAY ABSORPTION;

EID: 33749606383     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la061016r     Document Type: Article
Times cited : (43)

References (66)
  • 11
    • 0346704264 scopus 로고    scopus 로고
    • Xia, Y.; et al. Chem. Rev. 1999, 99, 1823;
    • (1999) Chem. Rev. , vol.99 , pp. 1823
    • Xia, Y.1
  • 27
    • 33749586793 scopus 로고    scopus 로고
    • Surface-Grafted polymer gradients: Formation, characterization and applications
    • Bhat, R. R.; Tomlinson, M. R.; Wu, T.; Genzer, I. Surface-Grafted Polymer Gradients: Formation, Characterization and Applications. Adv. Polym. Sci. 2006, 198, 51.
    • (2006) Adv. Polym. Sci. , vol.198 , pp. 51
    • Bhat, R.R.1    Tomlinson, M.R.2    Wu, T.3    Genzer, I.4
  • 29
    • 0141523234 scopus 로고    scopus 로고
    • Molecular gradients: Formation and applications in soft condensed matter science
    • Buschow, K. H. J., Cahn, R. W., Flemings, M. C., Ilschner, B., Kramer, E. J., Mahajan, S., Eds.; Elsevier: Oxford
    • Genzer, J. Molecular gradients: Formation and applications in soft condensed matter science. In Encyclopedia of Materials Science; Buschow, K. H. J., Cahn, R. W., Flemings, M. C., Ilschner, B., Kramer, E. J., Mahajan, S., Eds.; Elsevier: Oxford, 2002.
    • (2002) Encyclopedia of Materials Science
    • Genzer, J.1
  • 47
    • 33749603705 scopus 로고    scopus 로고
    • note
    • Certain commercial equipment is identified in this paper to specify adequately the experimental procedure. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the items identified are necessarily the best available for the purpose.
  • 52
    • 84859676016 scopus 로고    scopus 로고
    • For detailed information about the NIST/Dow Soft X-ray Materials Characterization Facility at NSLS BNL, see: http://nslsweb.nsls.bnl.gov/nsls/ pubs/newsletters/96-nov.pdf.
  • 66
    • 0035917242 scopus 로고    scopus 로고
    • Tamada K.; et al. Langmuir 2001, 17, 1913-1921.
    • (2001) Langmuir , vol.17 , pp. 1913-1921
    • Tamada, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.