An X-ray photoelectron spectroscopy study of the bonding of unsaturated organic molecules to the Si(001) surface

Surface Science

Volumn 416, Issue 3, 1998, Pages 354-362

  Liu, Hongbing ^a   Hamers, Robert J ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

Ab initio quantum chemical methods and calculations; Alkanes; Alkenes; Alkynes; Chemisorption; Crystallization; Surface chemical reaction; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ADSORPTION; BINDING ENERGY; CHEMICAL BONDS; CHEMISORPTION; CRYSTALLIZATION; OLEFINS; PARAFFINS; QUANTUM THEORY; SURFACE CHEMISTRY; SURFACE PHENOMENA; UNSATURATED COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

QUANTUM CHEMICAL THEORY;

SEMICONDUCTING SILICON;

EID: 0032182571     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00507-X     Document Type: Article

References (36)

1. M.J. Bozack, P.A. Taylor, W.J. Choyke, J.T. Yates, Surf. Sci. 177 (1986) L933.
2. C. Huang, W. Widdra, X.S. Wang, W.H. Weinberg, J. Vac. Sci. Technol. A 11 (1993) 2250.
3. C. Huang, W. Widdra, W.H. Weinberg, Surf. Sci. 315 (1994) L953.
4. W. Widdra, C. Huang, W.H. Weinberg, Surf. Sci. 329 (1995) 295.
5. B.I. Craig, P.V. Smith, Surf. Sci. 276 (1992) 174.
6. B.I. Craig, Surf. Sci. 329 (1995) 293.
7. A.J. Fisher, P.E. Blochl, G.A.D. Briggs, Surf. Sci. 374 (1997) 298-305.
8. C.C. Chiu, S.B. Desu, J. Mater. Res. 8 (1993) 535.
9. L. Clemen, R.M. Wallace, P.A. Taylor, M.J. Dresser, W.J. Choyke, W.H. Weinberg, J.T. Yates, Surf. Sci. 268 (1992) 205.
10. P.A. Taylor, R.M. Wallace, C.C. Cheng, W.H. Weinberg, M.J. Dresser, W.J. Choyke, J.T. Yates, J. Am. Chem. Soc. 114 (1992) 6754.
11. J. Hovis, S. Lee, H. Liu, R.J. Hamers, J. Vac. Sci. Technol. B 15 (4) (1997) 1153.
12. R.J. Hammers, J. Hovis, S. Lee, H. Liu, J. Shan, J. Phys. Chem. 101 (1997) 1489.
13. J.S. Hovis, R.J. Hamers, J. Phys. Chem. B 101 (1997) 9581.
14. D.A. Shirley, Phys. Rev. B 5 (1972) 2709.
15. D. Watson, PHI-Matlab, Minneapolis, MN, 1996.
16. W.H. Press, B.P. Flannery, S.A. Teukolsky, Numerical Recipes in C, Cambridge University Press, Cambridge, 1988.
17. Y. Bard, Nonlinear Parameter Estimation, Academic Press, New York, 1974.
18. P.R. Bevinton, Data Reduction and Error Analysis for the Physical Sciences, McGraw-Hill, New York, 1992.
19. S. Kinoshita, T. Ohta, H. Kuroda, Bull. Chem. Soc. Jpn. 49 (1976) 1149.
20. T. Halicioglu, Thin Solid Films 249 (1994) 78.
21. G.A.D. Briggs, J. Knall, A.J. Mayne, T.S. Jones, W.H. Weinberg, A.R. Avery, Nanotechnology 3 (1992) 113.
22. M.J. Dresser, P.A. Taylor, R.M. Wallace, W.J. Choyke, J.T. Yates, Surf. Sci. 218 (1989) 75.
23. C.U.S. Larsson, C.B.M. Anderson, N.P. Prince, A.S. Flodström, Surf. Sci. 271 (1992) 349.
24. F. Bozson, P. Avouris, Phys. Rev. Lett. 57 (1986) 1185.
25. F. Bozson, P. Avouris, Phys. Rev. B 38 (1988) 3937.
26. M. Fujisawa, Y. Taguchi, Y. Kawahare, M. Onchi, M. Nishijima, Phys. Rev. B 39 (1989) 12918.
27. G. Dufour, F. Rochet, H. Roulet, F. Sirotti, Surf. Sci. 304 (1994) 33.
28. T.D. Thomas, J. Chem. Phys. 52 (1970) 1373.
29. J.J. Pireau, S. Svensson, E. Basilier, P.-A. Malmqvist, U. Gelius, R. Caudano, K. Siegbahn, Phys. Rev. A 14 (1976) 2133.
30. H. Bash, L.C. Snyder, Chem. Phys. Lett. 3 (1969) 333.
31. A. Naves de Brito, S. Svensson, M.P. Keane, L. Karlsson, H. Agren, N. Correla, Eurphys. Lett. 30 (1992) 205.
32. N. Mårtensson, A. Nilsson, J. Electron Spectrosc. Relat. Phenom. 75 (1995) 209.
33. W.E. Palke, W.N. Lipscomb, J. Am. Chem. Soc. 88 (1966) 2384.
34. R.J. Beunker, S.D. Peyerimhoff, J.L. Whitten, J. Chem. Phys. 46 (1967) 2029.
35. R.C. Gray, J.C. Carver, D.M. Hercules, J. Electron Spectrosc. Relat. Phenom. 8 (1976) 343.
36. S. Kohiki, K. Oki, J. Electron Spectrosc. Relat. Phenom. 33 (1984) 375.