An option for the surface science on Cu chalcopyrites: The selenium capping and decapping process

Surface Science

Volumn 557, Issue 1-3, 2004, Pages 263-268

  Hunger, Ralf ^a,c   Schulmeyer, Thomas ^a   Klein, Andreas ^a   Jaegermann, Wolfram ^a   Sakurai, Keiichiro ^b   Yamada, Akimasa ^b   Fons, Paul ^b   Matsubara, Koji ^b   Niki, Shigeru ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

Chalcogens; Inorganic compounds; Low index single crystal surfaces; Reflection high energy electron diffraction (RHEED); Surface structure, morphology, roughness, and topography; Synchrotron radiation photoelectron spectroscopy

Indexed keywords

ANNEALING; ELECTRIC EXCITATION; ETCHING; EVAPORATION; INORGANIC ACIDS; PHOTOELECTRON SPECTROSCOPY; POLYCRYSTALLINE MATERIALS; SELENIUM; SINGLE CRYSTALS; STOICHIOMETRY; SURFACE ROUGHNESS; SYNCHROTRON RADIATION;

CHALCOGENS; LOW INDEX SINGLE CRYSTALS SURFACES; REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION (RHEED); SYNCHROTRON RADIATION PHOTOELECTRON SPECTROSCOPY;

COPPER COMPOUNDS;

EID: 2342655744     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.03.055     Document Type: Article

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