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Volumn 600, Issue 18, 2006, Pages 3718-3722

Focused ion beam induced swelling in MgO(0 0 1)

Author keywords

Atomic force microscopy; Defects; Focused ion beam; Ion bombardment; Ion solid interaction; Nanopatterning; Surface structure, morphology roughness and topography; Swelling

Indexed keywords

ATOMIC FORCE MICROSCOPY; EROSION; ION BOMBARDMENT; MAGNESIUM COMPOUNDS; MILLING (MACHINING); MORPHOLOGY; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY; SWELLING;

EID: 33748930615     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.01.084     Document Type: Article
Times cited : (11)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.