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Volumn 17, Issue 16, 2006, Pages 4204-4211
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Mapping van der Waals forces with frequency modulation dynamic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON TUNNELING;
GOLD;
MICROSCOPIC EXAMINATION;
PARAMETER ESTIMATION;
TOPOLOGY;
ULTRAHIGH VACUUM;
VAN DER WAALS FORCES;
FREQUENCY MODULATION DYNAMIC FORCE MICROSCOPY;
FREQUENCY SHIFT IMAGES;
FREQUENCY SHIFT PROFILES;
TIP-SUBSTRATE DISTANCE;
FREQUENCY MODULATION;
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EID: 33748889562
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/17/16/034 Document Type: Article |
Times cited : (5)
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References (34)
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