Measuring the effects of process variations on circuit performance by means of digitally-controllable ring oscillators

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2003, Pages 214-217

  Bassi, A ^a   Veggetti, A ^b   Croce, L ^b   Bogliolo, A ^c  

^a UNIVERSITY OF FERRARA   (Italy)

^b STMICROELECTRONICS   (Italy)

^c UNIVERSITY OF URBINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CONTROL SYSTEMS; ELECTRIC INVERTERS; MICROPROCESSOR CHIPS; OSCILLATIONS; OSCILLATORS (ELECTRONIC);

RING OSCILLATORS;

CMOS INTEGRATED CIRCUITS;

EID: 0038642444     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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