Transmission electron microscopy study of individual carbon nanotube breakdown caused by joule heating in air

Nano Letters

Volumn 6, Issue 8, 2006, Pages 1663-1668

  Mølhave, Kristian ^a   Gudnason, Sven Bjarke ^a   Pedersen, Anders Tegtmeier ^a   Clausen, Casper Hyttel ^a   Horsewell, Andy ^a   Bøggild, Peter ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTROCHEMICAL ELECTRODES; MICROPROCESSOR CHIPS; TRANSMISSION ELECTRON MICROSCOPY;

CANTILEVER ELECTRODES; DIFFUSIVE CONDUCTORS; JOULE HEATING; MICROFABRICATED CHIPS;

CARBON NANOTUBES;

CARBON NANOTUBE;

AIR; ARTICLE; CHEMISTRY; CONFORMATION; ELECTRIC CONDUCTIVITY; HEAT; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

AIR; ELECTRIC CONDUCTIVITY; HEAT; MATERIALS TESTING; MICROSCOPY, ELECTRON, TRANSMISSION; MOLECULAR CONFORMATION; NANOTUBES, CARBON; PARTICLE SIZE;

EID: 33748304402     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl060821n     Document Type: Article

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