Imaging suspended carbon nanotubes in field-effect transistors configured with microfabricated slits for transmission electron microscopy

Applied Physics Letters

Volumn 87, Issue 17, 2005, Pages 1-3

  Kim, Taekyung ^a   Zuo, Jian Min ^a   Olson, Eric A ^a   Petrov, Ivan ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTIPLE NANOTUBES; STRUCTURAL CHARACTERIZATION;

CHEMICAL VAPOR DEPOSITION; FIELD EFFECT TRANSISTORS; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBES;

EID: 28344450015     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2115070     Document Type: Article

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