Correlating the location of structural defects with the electrical failure of multiwalled carbon nanotubes

Applied Physics Letters

Volumn 75, Issue 25, 1999, Pages 3941-3943

  De Pablo, P J ^a   Howell, S ^b   Crittenden, S ^b   Walsh, B ^b   Graugnard, E ^b   Reifenberger, R ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000812095     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125501     Document Type: Article

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