Direct measurement of resistance of multiwalled carbon nanotubes using micro four-point probes

Sensor Letters

Volumn 3, Issue 4, 2005, Pages 300-303

  Dohn, Søren ^a   Mølhave, Kristian ^a   Bøggild, Peter ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Carbon nanotube; Characterization; Four point probe; Microelectrode; Resistance

Indexed keywords

CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; SILICA; SUBSTRATES;

MICRO FOUR-POINT PROBE; MULTIWALLED CARBON NANOTUBE; SILICON MICROFABRICATION;

PROBES;

EID: 33646541683     PISSN: 1546198X     EISSN: None     Source Type: Journal    
DOI: 10.1166/sl.2005.041     Document Type: Article

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