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Acta Physica Slovaca

Volumn 55, Issue 3, 2005, Pages 271-294

Combination of optical methods and atomic force microscopy at characterization of thin film systems

(3) Ohlidal I a Franta, D a Klapetek, P b

a MASARYK UNIVERSITY (Czech Republic)

b CZECH METROLOGY INSTITUTE (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33747628934 PISSN: 03230465 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (5)

References (27)

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