Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model

Applied Surface Science

Volumn 212-213, Issue SPEC., 2003, Pages 116-121

  Franta, Daniel ^a   Ohlídal, Ivan ^a   Frumar, Miloslav ^b   Jedelský, Jaroslav ^b  

^a MASARYK UNIVERSITY   (Czech Republic)

^b UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Amorphous solids; Chalcogenide thin films; Dispersion model of the optical constants

Indexed keywords

AMORPHOUS MATERIALS; BAND STRUCTURE; DENSITY (SPECIFIC GRAVITY); ELECTRONIC STRUCTURE;

AMORPHOUS SOLIDS;

THIN FILMS;

EID: 0038580479     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00412-4     Document Type: Conference Paper

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