Optical properties of ZnTe films prepared by molecular beam epitaxy

Thin Solid Films

Volumn 468, Issue 1-2, 2004, Pages 193-202

  Franta, Daniel ^a   Ohlídal, Ivan ^a   Klapetek, Petr ^a,b   Montaigne Ramil, Alberto ^c   Bonanni, Alberta ^c   Stifter, David ^c   Sitter, Helmut ^c  

^a MASARYK UNIVERSITY   (Czech Republic)

^b CZECH METROLOGY INSTITUTE   (Czech Republic)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Ellipsometry; Optical constants; Reflectometry; ZnTe epitaxial films

Indexed keywords

ELLIPSOMETRY; INTEGRATED OPTICS; MOLECULAR BEAM EPITAXY; OPTICAL PROPERTIES; REFLECTOMETERS; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE CRYSTALS; ZINC COMPOUNDS;

OPTICAL CONSTANTS; OPTICAL QUALITY; SPECTROSCOPIC ELLIPSOMETRY;

THIN FILMS;

EID: 4644273886     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.04.036     Document Type: Article

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