Ellipsometric parameters and reflectances of thin films with slightly rough boundaries

Journal of Modern Optics

Volumn 45, Issue 5, 1998, Pages 903-934

  Franta, Daniel ^a   Ohlídal, Ivan ^a  

^a MASARYK UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11744257049     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500349808230887     Document Type: Article

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