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Volumn 50, Issue 4, 2000, Pages 411-421
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Analysis of thin films by optical multi-sample methods
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0040195719
PISSN: 03230465
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (29)
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References (10)
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