-
2
-
-
0023172974
-
"Die attachment design and its influence on thermal stresses in the die and the attachment"
-
in New York
-
E. Suhir, "Die attachment design and its influence on thermal stresses in the die and the attachment," in Proc. 37th Electron. Compon. Conf., New York, 1987, pp. 508-517.
-
(1987)
Proc. 37th Electron. Compon. Conf.
, pp. 508-517
-
-
Suhir, E.1
-
3
-
-
85032143232
-
"Encapsulant of flip-chip structures"
-
in Baltimore, MD
-
S. C. Machuga, S. E. Lindsey, K. D. Moore, and A. F. Skipor, "Encapsulant of flip-chip structures," in Proc. IEEE/CHMT Int. Electron. Manuf. Technol. Symp., Baltimore, MD, 1992, pp. 53-58.
-
(1992)
Proc. IEEE/CHMT Int. Electron. Manuf. Technol. Symp.
, pp. 53-58
-
-
Machuga, S.C.1
Lindsey, S.E.2
Moore, K.D.3
Skipor, A.F.4
-
4
-
-
0141616061
-
"Mechanical behavior of flip-chip encapsulants"
-
Dec
-
E. Suhir and J. M. Segelken, "Mechanical behavior of flip-chip encapsulants," ASME J. Electron. Packag., vol. 112, pp. 327-332, Dec. 1990.
-
(1990)
ASME J. Electron. Packag.
, vol.112
, pp. 327-332
-
-
Suhir, E.1
Segelken, J.M.2
-
5
-
-
0030172955
-
"Parametric finite-element analysis of flip-chip structures"
-
C. P. Yeh, W. X. Zhou, and K. Wyatt, "Parametric finite-element analysis of flip-chip structures," Int. J. Microcircuits Electron. Packag., vol. 19, pp. 120-127, 1996.
-
(1996)
Int. J. Microcircuits Electron. Packag.
, vol.19
, pp. 120-127
-
-
Yeh, C.P.1
Zhou, W.X.2
Wyatt, K.3
-
6
-
-
0030714913
-
"Stresses from flip-chip assembly and underfill: Measurements with the ATC4.1 assembly test chip and analysis by finite-element method"
-
in San Jose, CA
-
D. W. Peterson, J. N. Sweet, S. N. Burchett, and A. Hsia, "Stresses from flip-chip assembly and underfill: Measurements with the ATC4.1 assembly test chip and analysis by finite-element method," in Proc. 47th Electron. Compon. Technol. Conf., San Jose, CA, 1997, pp. 134-143.
-
(1997)
Proc. 47th Electron. Compon. Technol. Conf.
, pp. 134-143
-
-
Peterson, D.W.1
Sweet, J.N.2
Burchett, S.N.3
Hsia, A.4
-
7
-
-
0031619646
-
"Analysis and modeling verification for thermal-mechanical deformation in flip-chip packages"
-
in Seattle, WA
-
J. H. Zhao, X. Dai, and P. S. Ho, "Analysis and modeling verification for thermal-mechanical deformation in flip-chip packages," in Proc. 48th Electron. Compon. Technol. Conf., Seattle, WA, 1998, pp. 336-344.
-
(1998)
Proc. 48th Electron. Compon. Technol. Conf.
, pp. 336-344
-
-
Zhao, J.H.1
Dai, X.2
Ho, P.S.3
-
8
-
-
0032304121
-
"Potential failure sites in a flip-chip package with and without underfill"
-
Dec
-
E. Madenci, S. Shkarayey, and R. Mahajan, "Potential failure sites in a flip-chip package with and without underfill," ASME J. Electron. Packag., vol. 120, pp. 336-341, Dec. 1998.
-
(1998)
ASME J. Electron. Packag.
, vol.120
, pp. 336-341
-
-
Madenci, E.1
Shkarayey, S.2
Mahajan, R.3
-
9
-
-
0031999316
-
"Investigation of interfacial fracture behavior of a flip-chip package under a constant concentrated load"
-
Feb
-
J. Wang, M. Lu, D. Zou, and S. Liu, "Investigation of interfacial fracture behavior of a flip-chip package under a constant concentrated load," IEEE Trans. Comp., Packag., Manuf. Technol. B, vol. 21, no. 1, pp. 79-86, Feb. 1998.
-
(1998)
IEEE Trans. Comp., Packag., Manuf. Technol. B
, vol.21
, Issue.1
, pp. 79-86
-
-
Wang, J.1
Lu, M.2
Zou, D.3
Liu, S.4
-
10
-
-
0032094788
-
"Two test specimens for determining the interfacial fracture toughness in flip-chip assemblies"
-
X. Yan and R. K. Agarwal, "Two test specimens for determining the interfacial fracture toughness in flip-chip assemblies," ASME J. Electron. Packag., vol. 120, pp. 150-155, 1998.
-
(1998)
ASME J. Electron. Packag.
, vol.120
, pp. 150-155
-
-
Yan, X.1
Agarwal, R.K.2
-
11
-
-
0032642313
-
"Calculation and validation of thermomechanical stresses in flip chip BGA using the ATC4.2 test vehicle"
-
in San Diego, CA
-
D. W. Peterson, S. N. Burchett, J. N. Sweet, R. T. Mitchell, and L. Nguyen, "Calculation and validation of thermomechanical stresses in flip chip BGA using the ATC4.2 test vehicle," in Proc. 49th Electron. Compon. Technol. Conf., San Diego, CA, 1999, pp. 1241-1248.
-
(1999)
Proc. 49th Electron. Compon. Technol. Conf.
, pp. 1241-1248
-
-
Peterson, D.W.1
Burchett, S.N.2
Sweet, J.N.3
Mitchell, R.T.4
Nguyen, L.5
-
12
-
-
0032657594
-
"Effect of thermal residual stresses on the apparent interfacial fracture toughness of polymer/metal interface"
-
in San Diego, CA
-
Q. Yao and J. Qu, "Effect of thermal residual stresses on the apparent interfacial fracture toughness of polymer/metal interface," in Proc. 49th Electron. Compon. Technol. Conf., San Diego, CA, 1999, pp. 365-368.
-
(1999)
Proc. 49th Electron. Compon. Technol. Conf.
, pp. 365-368
-
-
Yao, Q.1
Qu, J.2
-
13
-
-
0033326202
-
"Die cracking and reliable die design for flip-chip assemblies"
-
Nov
-
S. Michaelides and S. K. Sitaraman, "Die cracking and reliable die design for flip-chip assemblies," IEEE Trans. Adv. Packag., vol. 22, no. 4, pp. 602-613, Nov. 1999.
-
(1999)
IEEE Trans. Adv. Packag.
, vol.22
, Issue.4
, pp. 602-613
-
-
Michaelides, S.1
Sitaraman, S.K.2
-
14
-
-
0034476694
-
"Improved bonding pad design for fluxless flip chip bonding process and low fracture strength substrates"
-
in Las Vegas, NV
-
R. Bonda, Y. Guo, J. Stafford, and G. Swan, "Improved bonding pad design for fluxless flip chip bonding process and low fracture strength substrates," in Proc. 50th Electron. Compon. Technol. Conf., Las Vegas, NV, 2000, pp. 1701-1704.
-
(2000)
Proc. 50th Electron. Compon. Technol. Conf.
, pp. 1701-1704
-
-
Bonda, R.1
Guo, Y.2
Stafford, J.3
Swan, G.4
-
15
-
-
0038414268
-
"Interfacial delamination near solder bumps and UBM in flip-chip packages"
-
Sep
-
G. Yu, T. Nakamura, W. T. Chen, and B. Cotterell, "Interfacial delamination near solder bumps and UBM in flip-chip packages," ASME J. Electron. Packag., vol. 123, pp. 295-301, Sep. 2001.
-
(2001)
ASME J. Electron. Packag.
, vol.123
, pp. 295-301
-
-
Yu, G.1
Nakamura, T.2
Chen, W.T.3
Cotterell, B.4
-
16
-
-
0036826639
-
"Characterization of lead-free solders and under bump metallurgies for flip-chip package"
-
Oct
-
J.-K. Lin, A. De Silva, D. Frear, Y. Guo, S. Hayes, J.-W. Jang, L. Li, D. Mitchell, B. Yeung, and C. Zhang, "Characterization of lead-free solders and under bump metallurgies for flip-chip package," IEEE Trans. Electron. Packag. Manuf., vol. 25, no. 4, pp. 300-307, Oct. 2002.
-
(2002)
IEEE Trans. Electron. Packag. Manuf.
, vol.25
, Issue.4
, pp. 300-307
-
-
Lin, J.-K.1
De Silva, A.2
Frear, D.3
Guo, Y.4
Hayes, S.5
Jang, J.-W.6
Li, L.7
Mitchell, D.8
Yeung, B.9
Zhang, C.10
-
17
-
-
0141964186
-
"Stresses and fracture at the chip/underfill interface in flip-chip assemblies"
-
Mar
-
J. E. Park, I. Jasiuk, and A. Zubelewicz, "Stresses and fracture at the chip/underfill interface in flip-chip assemblies," ASME J. Electron. Packag., vol. 125, pp. 44-52, Mar. 2003.
-
(2003)
ASME J. Electron. Packag.
, vol.125
, pp. 44-52
-
-
Park, J.E.1
Jasiuk, I.2
Zubelewicz, A.3
-
18
-
-
0041384488
-
"Investigation on flip chip solder joint fatigue with cure-dependent underfill properties"
-
Jun
-
D. G. Yang, G. Q. Zhang, L. J. Ernst, C. van't Hof, J. F. J. M. Caers, H. J. L. Bressers, and J. H. J. Janssen, "Investigation on flip chip solder joint fatigue with cure-dependent underfill properties," IEEE Trans. Comp. Packag. Technol., vol. 26, no. 2, pp. 388-398, Jun. 2003.
-
(2003)
IEEE Trans. Comp. Packag. Technol.
, vol.26
, Issue.2
, pp. 388-398
-
-
Yang, D.G.1
Zhang, G.Q.2
Ernst, L.J.3
van't Hof, C.4
Caers, J.F.J.M.5
Bressers, H.J.L.6
Janssen, J.H.J.7
-
19
-
-
13944257961
-
"SRC Report 2003"
-
Semiconductor Research Corporation, Phoenix, AZ, Task ID 1011.001
-
Y. Lin et al., "SRC Report 2003," Semiconductor Research Corporation, Phoenix, AZ, 2003. Task ID 1011.001.
-
(2003)
-
-
Lin, Y.1
-
20
-
-
13944277275
-
"Reliability issues of low-cost overmolded flip chip packages"
-
Feb
-
Y. Lin, W. Liu, Y. Guo, and F. G. Shi, "Reliability issues of low-cost overmolded flip chip packages," IEEE Trans. Adv. Packag., vol. 28, no. 1, pp. 79-88, Feb. 2005.
-
(2005)
IEEE Trans. Adv. Packag.
, vol.28
, Issue.1
, pp. 79-88
-
-
Lin, Y.1
Liu, W.2
Guo, Y.3
Shi, F.G.4
-
21
-
-
0009964656
-
-
Santa Ana, CA: MSC Software Corporation
-
MSC.MARC User's Guide. Santa Ana, CA: MSC Software Corporation, 2001.
-
(2001)
MSC.MARC User's Guide
-
-
-
22
-
-
0004034857
-
-
New York: McGraw-Hill
-
J. H. Lau, C. P. Wong, J. L. Prince, and W. Nakayama, Electronic Packaging: Design, Materials, Process, and Reliability. New York: McGraw-Hill, 1998.
-
(1998)
Electronic Packaging: Design, Materials, Process, and Reliability
-
-
Lau, J.H.1
Wong, C.P.2
Prince, J.L.3
Nakayama, W.4
-
23
-
-
0004034858
-
-
Boca Raton, FL: CRC
-
M. G. Pecht, R. Agarwal, P. McCluskey, T. Dishongh, S. Javadpour, and R. Mahajan, Electronics Packaging Materials and Their Properties. Boca Raton, FL: CRC, 1999.
-
(1999)
Electronics Packaging Materials and Their Properties
-
-
Pecht, M.G.1
Agarwal, R.2
McCluskey, P.3
Dishongh, T.4
Javadpour, S.5
Mahajan, R.6
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