Recombination traffic in highly crystallized undoped microcrystalline Si films studied by steady state photoconductivity

Thin Solid Films

Volumn 511-512, Issue , 2006, Pages 556-561

  Ram, Sanjay K ^a   Kumar, Satyendra ^a   Vanderhaghen, R ^b   Drevillon, B ^b   Rocca i Cabarrocas, P ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^b LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

Density of states; Electronic transport properties; Photoconductivity; Silicon; Thin Films

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; ELECTRONIC DENSITY OF STATES; GRAIN BOUNDARIES; HOLE TRAPS; HYDROGENATION; MICROSTRUCTURE; PHOTOCONDUCTIVITY; SILICON;

GRAIN BOUNDARY DEFECTS; LIGHT INTENSITY; MICROCRYSTALLINE SILICON; VALENCE BAND TAILS (VBT);

THIN FILMS;

EID: 33747434035     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.002     Document Type: Article

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