Band-tail profiling in microcrystalline silicon by photoconductivity analysis

Journal of Applied Physics

Volumn 92, Issue 5, 2002, Pages 2540-2543

  Bruggemann R ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND TAIL; DENSITY-OF-STATES; HYBRID FORMS; LOCALIZED STATE;

PHYSICAL PROPERTIES; PHYSICS;

CONDUCTION BANDS;

EID: 84861426236     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1499218     Document Type: Article

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