-
2
-
-
0029492542
-
Fast sparse aerial image calculation for OPC
-
N. Cobb and A. Zakhor, "Fast sparse aerial image calculation for OPC," in BACUS Symposium on Photomask Technology, Proc. SPIE 2621, pp. 534-545, 1995.
-
(1995)
BACUS Symposium on Photomask Technology, Proc. SPIE
, vol.2621
, pp. 534-545
-
-
Cobb, N.1
Zakhor, A.2
-
4
-
-
0023244507
-
Development of positive photoresist
-
C. Mack, "Development of positive photoresist," Journal of Electrochemical Society 134, pp. 148-152, 1987.
-
(1987)
Journal of Electrochemical Society
, vol.134
, pp. 148-152
-
-
Mack, C.1
-
5
-
-
0034852070
-
Toward a universal resist dissolution model for lithography simulation
-
S. Robertson, C. Mack, and M. Maslow, "Toward a universal resist dissolution model for lithography simulation," in Lithography for Semiconductor Manufacturing II, Proc. SPIE 4404, pp. 111-122, 2001.
-
(2001)
Lithography for Semiconductor Manufacturing II, Proc. SPIE
, vol.4404
, pp. 111-122
-
-
Robertson, S.1
Mack, C.2
Maslow, M.3
-
6
-
-
3843070851
-
Two threshold resist models for optical proximity correction
-
W. Huang, C. Lin, C. Kuo, C. Huang, J. Lin, J. Chen, R. Liu, Y. Ku, and B. Lin, "Two threshold resist models for optical proximity correction," in Optical Microlithography, Proc. SPIE 5377, pp. 1536-1543, 2001.
-
(2001)
Optical Microlithography, Proc. SPIE
, vol.5377
, pp. 1536-1543
-
-
Huang, W.1
Lin, C.2
Kuo, C.3
Huang, C.4
Lin, J.5
Chen, J.6
Liu, R.7
Ku, Y.8
Lin, B.9
-
7
-
-
0032636562
-
Variable threshold resist models for lithography simulation
-
J. Randall, K. Ronse, T. Marschner, M. Goethals, and M. Ercken, "Variable threshold resist models for lithography simulation," in Optical Microlithography, Proc. SPIE 3679, pp. 176-182, 1999.
-
(1999)
Optical Microlithography, Proc. SPIE
, vol.3679
, pp. 176-182
-
-
Randall, J.1
Ronse, K.2
Marschner, T.3
Goethals, M.4
Ercken, M.5
-
8
-
-
25144522920
-
Novel approximate model for resist process
-
C. Ahn, H. Kim, and K. Baik, "Novel approximate model for resist process," in Optical Microlithography, Proc. SPIE 3334, pp. 752-763, 1998.
-
(1998)
Optical Microlithography, Proc. SPIE
, vol.3334
, pp. 752-763
-
-
Ahn, C.1
Kim, H.2
Baik, K.3
-
9
-
-
3843089361
-
Resolution enhancement technology: The past, the present, and extensions for the future
-
Optical Microlithography, B. W. Smith, ed.
-
F. Schellenberg, "Resolution enhancement technology: The past, the present, and extensions for the future," in Optical Microlithography, B. W. Smith, ed., Proc. SPIE 5377, pp. 1-20, 2004.
-
(2004)
Proc. SPIE
, vol.5377
, pp. 1-20
-
-
Schellenberg, F.1
-
11
-
-
0035465564
-
TCAD development for lithography resolution enhancement
-
L. Liebmann, S. Mansfield, A. Wong, M. Lavin, W. Leipold, and T.Dunham, "TCAD development for lithography resolution enhancement," IBM Journal of Research and Development 45, pp. 651-665, 2001.
-
(2001)
IBM Journal of Research and Development
, vol.45
, pp. 651-665
-
-
Liebmann, L.1
Mansfield, S.2
Wong, A.3
Lavin, M.4
Leipold, W.5
Dunham, T.6
-
13
-
-
33644596206
-
Inverse lithography technology principles in practice: Unintuitive patterns
-
Y. Liu, D. Abrams, L. Pang, and A. Moore, "Inverse lithography technology principles in practice: Unintuitive patterns," in BACUS Symposium on Photomask Technology, Proc. SPIE 5992, pp. 231-238, 2005.
-
(2005)
BACUS Symposium on Photomask Technology, Proc. SPIE
, vol.5992
, pp. 231-238
-
-
Liu, Y.1
Abrams, D.2
Pang, L.3
Moore, A.4
-
15
-
-
0021892214
-
Image design: Generation of a prescribed image through a diffraction limited system with high-contrast recording
-
S. Sayegh, B. Saleh, and K. Nashold, "Image design: Generation of a prescribed image through a diffraction limited system with high-contrast recording," IEEE Transaction on Acoustics, Speech and Signal Processing 33, pp. 460-465, 1985.
-
(1985)
IEEE Transaction on Acoustics, Speech and Signal Processing
, vol.33
, pp. 460-465
-
-
Sayegh, S.1
Saleh, B.2
Nashold, K.3
-
16
-
-
0029377796
-
Binary image synthesis using mixed linear integer programming
-
S. Sherif, B. Saleh, and R. Leone, "Binary image synthesis using mixed linear integer programming," IEEE Transactions on Image Processing 4, pp. 1252-1257, 1995.
-
(1995)
IEEE Transactions on Image Processing
, vol.4
, pp. 1252-1257
-
-
Sherif, S.1
Saleh, B.2
Leone, R.3
-
19
-
-
0032652497
-
Resolution enhancement through optical proximity correction and stepper parameter optimization for 0.12-μ m mask pattern
-
Y. Oh, J. C. Lee, and S. Lim, "Resolution enhancement through optical proximity correction and stepper parameter optimization for 0.12-μ m mask pattern," in Optical Microlithography, Proc. SPIE 3679, pp. 607-613, 1999.
-
(1999)
Optical Microlithography, Proc. SPIE
, vol.3679
, pp. 607-613
-
-
Oh, Y.1
Lee, J.C.2
Lim, S.3
-
20
-
-
3843087204
-
Towards automatic mask and source optimization for optical lithography
-
A. Erdmann, R. Farkas, T. Fuhner, B. Tollkuhn, and G. Kokai, "Towards automatic mask and source optimization for optical lithography," in Optical Microlithography, Proc. SPIE 5377, pp. 646-657, 2004.
-
(2004)
Optical Microlithography, Proc. SPIE
, vol.5377
, pp. 646-657
-
-
Erdmann, A.1
Farkas, R.2
Fuhner, T.3
Tollkuhn, B.4
Kokai, G.5
-
21
-
-
25144486100
-
Solving inverse problems of optical microlithography
-
Y. Granik, "Solving inverse problems of optical microlithography, " in Optical Microlithography, Proc. SPIE 5754, pp. 506-526, 2005.
-
(2005)
Optical Microlithography, Proc. SPIE
, vol.5754
, pp. 506-526
-
-
Granik, Y.1
-
22
-
-
21944435130
-
Prewarping techniques in imaging: Applications in nanotechnology and biotechnology
-
A. Poonawala and P. Milanfar, "Prewarping techniques in imaging: Applications in nanotechnology and biotechnology," in Electronic Imaging, Proc. SPIE 5674, pp. 114-127, 2005.
-
(2005)
Electronic Imaging, Proc. SPIE
, vol.5674
, pp. 114-127
-
-
Poonawala, A.1
Milanfar, P.2
-
24
-
-
0000400323
-
Survey of neural transfer functions
-
W. Duch and N. Jankowski, "Survey of neural transfer functions," Computing Surveys 2, pp. 163-213, 1999.
-
(1999)
Computing Surveys
, vol.2
, pp. 163-213
-
-
Duch, W.1
Jankowski, N.2
-
27
-
-
35048885386
-
Fast and low-complexity mask design in optical microlithography - An inverse imaging problem
-
submitted to
-
A. Poonawala and P. Milanfar, "Fast and low-complexity mask design in optical microlithography - an inverse imaging problem," submitted to IEEE Transactions on Image Processing.
-
IEEE Transactions on Image Processing
-
-
Poonawala, A.1
Milanfar, P.2
-
29
-
-
4544374765
-
Fast and robust multi-frame super-resolution
-
S. Farsiu, D. Robinson, M. Elad, and P. Milanfar, "Fast and robust multi-frame super-resolution," IEEE Transcation on Image Processing 13, pp. 1327-1344, 2004.
-
(2004)
IEEE Transcation on Image Processing
, vol.13
, pp. 1327-1344
-
-
Farsiu, S.1
Robinson, D.2
Elad, M.3
Milanfar, P.4
|