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Volumn 5992, Issue 2, 2005, Pages

Inverse lithography technology principles in practice: Unintuitive patterns

Author keywords

Inverse Lithography Technology (ILT); Lithography; OPC; RET

Indexed keywords

INVERSE LITHOGRAPHY TECHNOLOGY (ILT); OPC; RET;

EID: 33644596206     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.632366     Document Type: Conference Paper
Times cited : (43)

References (8)
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  • 2
    • 84975575678 scopus 로고
    • Image construction through diffraction-limited high-contrast imaging systems: An iterative approach
    • K.M. Nashold and B.E.A. Saleh, Image construction through diffraction-limited high-contrast imaging systems: an iterative approach, J. Opt. Soc. Am. A, vol. 2 p. 635 (1985)
    • (1985) J. Opt. Soc. Am. A , vol.2 , pp. 635
    • Nashold, K.M.1    Saleh, B.E.A.2
  • 3
    • 0025594854 scopus 로고
    • Optimal binary image design for optical lithography
    • Y. Liu and A. Zakhor, Optimal binary image design for optical lithography, Proc. SPIE Vol. 1264 pp 410-412 (1990)
    • (1990) Proc. SPIE , vol.1264 , pp. 410-412
    • Liu, Y.1    Zakhor, A.2
  • 4
    • 0026372910 scopus 로고
    • Binary and phase-shifting image design for optical lithography
    • Y. Liu and A. Zakhor, Binary and phase-shifting image design for optical lithography, Proc. SPIE Vol. 1463 pp 382-399 (1991)
    • (1991) Proc. SPIE , vol.1463 , pp. 382-399
    • Liu, Y.1    Zakhor, A.2
  • 5
    • 0029235851 scopus 로고
    • Automated design of halftoned double-exposure phase-shifting masks
    • Y-T Wang, Y.C. Pati, H. Watanabe and T. Kailath, Automated design of halftoned double-exposure phase-shifting masks, Proc. SPIE Vol. 2440 pp 290-301 (1995)
    • (1995) Proc. SPIE , vol.2440 , pp. 290-301
    • Wang, Y.-T.1    Pati, Y.C.2    Watanabe, H.3    Kailath, T.4
  • 6
    • 0038303181 scopus 로고    scopus 로고
    • Manufacturability evaluation of model-based OPC masks
    • S-H Jang el. al, Manufacturability evaluation of model-based OPC masks, Proc. SPIE vol. 4889 p 520 (2002)
    • (2002) Proc. SPIE , vol.4889 , pp. 520
    • Jang, S.-H.1
  • 7
    • 71549126234 scopus 로고    scopus 로고
    • Optimum mask and source patterns to print a given shape
    • A. Rosenbluth et. al, Optimum mask and source patterns to print a given shape, JM3 vol. 1 pp 13-30 (2002)
    • (2002) JM3 , vol.1 , pp. 13-30
    • Rosenbluth, A.1
  • 8
    • 25144510087 scopus 로고    scopus 로고
    • Improved mask and source representations for automatic optimization of lithographic process conditions using a genetic algorithm
    • T. Fuhner and A.Erdmann, Improved mask and source representations for automatic optimization of lithographic process conditions using a genetic algorithm, Proc. SPIE Vol. 5754 pp 415-426 (2005)
    • (2005) Proc. SPIE , vol.5754 , pp. 415-426
    • Fuhner, T.1    Erdmann, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.