메뉴 건너뛰기




Volumn 77, Issue 6, 2006, Pages

Scanning near-field optical microscope working with a CdSe/ZnS quantum dot based optical detector

Author keywords

[No Author keywords available]

Indexed keywords

NEAR FIELD SCANNING OPTICAL MICROSCOPY; PROBES; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; SILICA; THIN FILMS; ZINC SULFIDE;

EID: 33745727609     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2204621     Document Type: Article
Times cited : (20)

References (41)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.